{"title":"物联网可靠性设计探索性分析方法","authors":"Khushwant Singh, Mohit Yadav, Yudhvir Singh, Dheer Dhwaz Barak, Ashish Saini, Fernando Moreira","doi":"10.3389/fcomp.2024.1382347","DOIUrl":null,"url":null,"abstract":"The Internet of Things (IoT) proposes to transform human civilization so that it is smart, practical, and highly efficient, with enormous potential for commercial as well as social and environmental advantages. Reliability is one of the major problems that must be resolved to enable this revolutionary change. The reliability issues raised with specific supporting technologies for each tier according to the layered IoT reliability are initially described in this research. The research then offers a complete review and assessment of IoT reliability. In this paper, various types of reliability on the IoT have been analyzed with each layer of IoT to solve the issues of failure rates, latency, MTTF, and MTBF. Each parameter has a certain classification and perception as well as enhancement in efficiency, accuracy, precision, timeliness, and completeness. Reliability models provide efficient solutions for different IoT problems, which are mirrored in the proposed study and classified with four types of reliabilities. The field of IoT reliability exploration is still in its initial phases, despite a sizable research record. Furthermore, the recent case study of CHISS is elaborated with discovered behaviors including brand-new aspects such as the multifaceted nature of evolving IoT systems, research opportunities, and difficulties.","PeriodicalId":510141,"journal":{"name":"Frontiers in Computer Science","volume":"7 2","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reliability on the Internet of Things with designing approach for exploratory analysis\",\"authors\":\"Khushwant Singh, Mohit Yadav, Yudhvir Singh, Dheer Dhwaz Barak, Ashish Saini, Fernando Moreira\",\"doi\":\"10.3389/fcomp.2024.1382347\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Internet of Things (IoT) proposes to transform human civilization so that it is smart, practical, and highly efficient, with enormous potential for commercial as well as social and environmental advantages. Reliability is one of the major problems that must be resolved to enable this revolutionary change. The reliability issues raised with specific supporting technologies for each tier according to the layered IoT reliability are initially described in this research. The research then offers a complete review and assessment of IoT reliability. In this paper, various types of reliability on the IoT have been analyzed with each layer of IoT to solve the issues of failure rates, latency, MTTF, and MTBF. Each parameter has a certain classification and perception as well as enhancement in efficiency, accuracy, precision, timeliness, and completeness. Reliability models provide efficient solutions for different IoT problems, which are mirrored in the proposed study and classified with four types of reliabilities. The field of IoT reliability exploration is still in its initial phases, despite a sizable research record. Furthermore, the recent case study of CHISS is elaborated with discovered behaviors including brand-new aspects such as the multifaceted nature of evolving IoT systems, research opportunities, and difficulties.\",\"PeriodicalId\":510141,\"journal\":{\"name\":\"Frontiers in Computer Science\",\"volume\":\"7 2\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-06-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Frontiers in Computer Science\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3389/fcomp.2024.1382347\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Frontiers in Computer Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3389/fcomp.2024.1382347","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability on the Internet of Things with designing approach for exploratory analysis
The Internet of Things (IoT) proposes to transform human civilization so that it is smart, practical, and highly efficient, with enormous potential for commercial as well as social and environmental advantages. Reliability is one of the major problems that must be resolved to enable this revolutionary change. The reliability issues raised with specific supporting technologies for each tier according to the layered IoT reliability are initially described in this research. The research then offers a complete review and assessment of IoT reliability. In this paper, various types of reliability on the IoT have been analyzed with each layer of IoT to solve the issues of failure rates, latency, MTTF, and MTBF. Each parameter has a certain classification and perception as well as enhancement in efficiency, accuracy, precision, timeliness, and completeness. Reliability models provide efficient solutions for different IoT problems, which are mirrored in the proposed study and classified with four types of reliabilities. The field of IoT reliability exploration is still in its initial phases, despite a sizable research record. Furthermore, the recent case study of CHISS is elaborated with discovered behaviors including brand-new aspects such as the multifaceted nature of evolving IoT systems, research opportunities, and difficulties.