用集成式双色宽带 SU(1,1)- 干涉仪测量超短双光子相关时间

F. Roeder, R. Pollmann, M. Stefszky, M. Santandrea, K.-H. Luo, V. Quiring, R. Ricken, C. Eigner, B. Brecht, C. Silberhorn
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引用次数: 0

摘要

双光子相关时间是衡量来自光子对源的两个光子在时间上到达的条件不确定性的指标,是许多量子光谱学应用的关键性能标识符,相关时间越短通常性能越好。此外,它还能让我们从根本上了解色散对双光子态的影响。在这里,我们展示了可以利用时间干涉图宽度的特征依赖性来深入了解干涉仪内部的二阶色散量,并检索约 100fs 的实际和傅里叶限制超短双光子相关时间。在提出的方案中,我们同时测量了基于 Ti:LiNbO3 波导中集成宽带参量下转换源的 SU(1,1) 干涉仪输出端的光谱和时间干涉图。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Measurement of Ultrashort Biphoton Correlation Times with an Integrated Two-Color Broadband SU(1,1)-Interferometer

Measurement of Ultrashort Biphoton Correlation Times with an Integrated Two-Color Broadband SU(1,1)-Interferometer
The biphoton correlation time, a measure for the conditional uncertainty in the temporal arrival of two photons from a photon pair source, is a key performance identifier for many quantum spectroscopy applications, with shorter correlation times typically yielding better performance. Furthermore, it provides fundamental insight into the effects of dispersion on the biphoton state. Here, we show that a characteristic dependence of the width of the temporal interferogram can be exploited to obtain insights into the amount of second-order dispersion inside the interferometer and to retrieve actual and Fourier-limited ultrashort biphoton correlation times of around 100fs. In the presented scheme, we simultaneously measure spectral and temporal interferograms at the output of an SU(1,1) interferometer based on an integrated broadband parametric down-conversion source in a Ti:LiNbO3 waveguide.
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