通过调节三甲基铟流量实现超高响应率 In2O3 UVA 光电探测器

Crystals Pub Date : 2024-05-24 DOI:10.3390/cryst14060494
Yifei Li, Tiwei Chen, Yongjian Ma, Yu Hu, Li Zhang, Xiaodong Zhang, Jinghang Yang, Lu Wang, Huanyu Zhang, Changling Yan, Zhongming Zeng, Baoshun Zhang
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引用次数: 0

摘要

氧空位(Vo)会显著降低氧化铟(In2O3)薄膜的电性能,从而限制其在紫外检测领域的应用。在这项研究中,通过调节三甲基铟(TMIn)的流速(fTMIn),可以有效抑制氧空位的产生。此外,随着 fTMIn 的降低,本底载流子浓度和薄膜的粗糙度也逐渐降低。当 fTMIn 为 5 sccm 时,可获得粗糙度为 0.44 nm 的光滑 In2O3 薄膜。基于不同 fTMIn 的 In2O3 薄膜构建了 MSM 光电探测器(PD),以研究薄膜的光电特性。随着 fTMIn 从 50 sccm 降低到 5 sccm,PD 的暗电流从 100 mA 显著降低到 0.28 μA,降低了五个数量级。此外,PD 的光响应能力也大幅提高。光暗电流比(PDCR)从 0 增加到 2589。最后,fTMIn 为 5 sccm 的光导二极管具有创纪录的高响应率(2.53 × 103 AW-1)、高检测率(5.43 × 107 Jones)和高 EQE(9383 × 100%)。我们的工作为制造高灵敏度紫外 PD 提供了重要参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ultrahigh Responsivity In2O3 UVA Photodetector through Modulation of Trimethylindium Flow Rate
Oxygen vacancies (Vo) can significantly degrade the electrical properties of indium oxide (In2O3) thin films, thus limiting their application in the field of ultraviolet detection. In this work, the Vo is effectively suppressed by adjusting the Trimethylindium (TMIn) flow rate (fTMIn). In addition, with the reduction of the fTMIn, the background carrier concentration and the roughness of the film decrease gradually. And a smooth In2O3 thin film with roughness of 0.44 nm is obtained when the fTMIn is 5 sccm. The MSM photodetectors (PDs) are constructed based on In2O3 thin films with different fTMIn to investigate the opto-electric characteristics of the films. The dark current of the PDs is significantly reduced by five orders from 100 mA to 0.28 μA with the reduction of the fTMIn from 50 sccm to 5 sccm. In addition, the photo response capacity of PDs is dramatically enhanced. The photo-to-dark current ratio (PDCR) increases from 0 to 2589. Finally, the PD with the fTMIn of 5 sccm possesses a record-high responsivity of 2.53 × 103 AW−1, a high detectivity of 5.43 × 107 Jones and a high EQE of 9383 × 100%. Our work provides an important reference for the fabrication of high-sensitivity UV PDs.
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