{"title":"用于 HL-LHC ATLAS MDT 室第二阶段升级的新型 ASD2 芯片的测试结果","authors":"K. Penski","doi":"10.1088/1748-0221/19/05/c05008","DOIUrl":null,"url":null,"abstract":"\n For the Phase-II upgrade of the ATLAS Muon Spectrometer to High-Luminosity LHC, new front-end readout electronics for the Monitored Drift Tube chambers is required, as the old one no longer meets the demands. The first stage in the Monitored Drift Tubes readout chain is the Amplifier-Shaper-Discriminator chip. For the upgrade, the new ASD2 ASIC chip in IBM 130 nm CMOS technology has been developed. For the ATLAS experiment, 80000 ASD2 chips are produced, which have to be tested before integration in order to obtain the required 50000 well-performing chips in the end. Using a prototype tester board and pre-production ASD2 chips, the overall performance and the influence on programmable parameters is investigated. Based on these results, 1775 production chips are tested to define final optimized cut values for the automated production testing of all chips in the company.","PeriodicalId":16184,"journal":{"name":"Journal of Instrumentation","volume":null,"pages":null},"PeriodicalIF":1.3000,"publicationDate":"2024-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Test result of the new ASD2 chips for Phase-II upgrade of the ATLAS MDT chambers at HL-LHC\",\"authors\":\"K. Penski\",\"doi\":\"10.1088/1748-0221/19/05/c05008\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n For the Phase-II upgrade of the ATLAS Muon Spectrometer to High-Luminosity LHC, new front-end readout electronics for the Monitored Drift Tube chambers is required, as the old one no longer meets the demands. The first stage in the Monitored Drift Tubes readout chain is the Amplifier-Shaper-Discriminator chip. For the upgrade, the new ASD2 ASIC chip in IBM 130 nm CMOS technology has been developed. For the ATLAS experiment, 80000 ASD2 chips are produced, which have to be tested before integration in order to obtain the required 50000 well-performing chips in the end. Using a prototype tester board and pre-production ASD2 chips, the overall performance and the influence on programmable parameters is investigated. Based on these results, 1775 production chips are tested to define final optimized cut values for the automated production testing of all chips in the company.\",\"PeriodicalId\":16184,\"journal\":{\"name\":\"Journal of Instrumentation\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2024-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Instrumentation\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1088/1748-0221/19/05/c05008\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Instrumentation","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1088/1748-0221/19/05/c05008","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
Test result of the new ASD2 chips for Phase-II upgrade of the ATLAS MDT chambers at HL-LHC
For the Phase-II upgrade of the ATLAS Muon Spectrometer to High-Luminosity LHC, new front-end readout electronics for the Monitored Drift Tube chambers is required, as the old one no longer meets the demands. The first stage in the Monitored Drift Tubes readout chain is the Amplifier-Shaper-Discriminator chip. For the upgrade, the new ASD2 ASIC chip in IBM 130 nm CMOS technology has been developed. For the ATLAS experiment, 80000 ASD2 chips are produced, which have to be tested before integration in order to obtain the required 50000 well-performing chips in the end. Using a prototype tester board and pre-production ASD2 chips, the overall performance and the influence on programmable parameters is investigated. Based on these results, 1775 production chips are tested to define final optimized cut values for the automated production testing of all chips in the company.
期刊介绍:
Journal of Instrumentation (JINST) covers major areas related to concepts and instrumentation in detector physics, accelerator science and associated experimental methods and techniques, theory, modelling and simulations. The main subject areas include.
-Accelerators: concepts, modelling, simulations and sources-
Instrumentation and hardware for accelerators: particles, synchrotron radiation, neutrons-
Detector physics: concepts, processes, methods, modelling and simulations-
Detectors, apparatus and methods for particle, astroparticle, nuclear, atomic, and molecular physics-
Instrumentation and methods for plasma research-
Methods and apparatus for astronomy and astrophysics-
Detectors, methods and apparatus for biomedical applications, life sciences and material research-
Instrumentation and techniques for medical imaging, diagnostics and therapy-
Instrumentation and techniques for dosimetry, monitoring and radiation damage-
Detectors, instrumentation and methods for non-destructive tests (NDT)-
Detector readout concepts, electronics and data acquisition methods-
Algorithms, software and data reduction methods-
Materials and associated technologies, etc.-
Engineering and technical issues.
JINST also includes a section dedicated to technical reports and instrumentation theses.