激光产生的等离子体中逸散电子的先进诊断技术

Plasma Pub Date : 2024-05-13 DOI:10.3390/plasma7020021
Josef Krása, Michal Krupka, Shubham Agarwal, Vincenzo Nassisi, Sushil Singh
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引用次数: 0

摘要

本文概述了与探测从激光产生的等离子体中逸出的热电子以及从地面流向目标的相应回流电流有关的最新问题,回流电流中和了目标上因逸出的电子而产生的正电荷。此外,目标支架系统还充当发射电磁脉冲(EMP)的天线,由返回目标供电。如果靶上产生的正电荷量等于逸出电子从等离子体带走的电荷量,则通过测量返回电流可以确定电荷量,从而确定逸出电子的数量。本文介绍了毫安-10 千安范围内的返回电流检测方法,并将相应的电荷与使用校准磁电子能量分析仪测定的电荷进行了比较。讨论了接地和绝缘目标对逸出电子数和电磁脉冲强度的影响。除了电磁脉冲检测之外,还提到了目标附近的电势映射。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Advanced Diagnostics of Electrons Escaping from Laser-Produced Plasma
This article provides an up-to-date overview of the problems associated with the detection of hot electrons escaping from laser-produced plasma and corresponding return current flowing from the ground to the target, which neutralises the positive charge occurring on the target due to the escaped electrons. In addition, the target holder system acts as an antenna emitting an electromagnetic pulse (EMP), which is powered by the return target. If the amount of positive charge generated on the target is equal to the amount of charge carried away from the plasma by the escaping electrons, the measurement of the return current makes it possible to determine this charge, and thus also the number of escaped electrons. Methods of return current detection in the mA–10 kA range is presented, and the corresponding charge is compared to the charge determined using calibrated magnetic electron energy analysers. The influence of grounded and insulated targets on the number of escaped electrons and EMP intensity is discussed. In addition to EMP detection, mapping of the electrical potential near the target is mentioned.
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