K Ichimura, K Chiba, Y Gando, H Ikeda, Y Kishimoto, M Kurasawa, K Nemoto, A Sakaguchi, Y Takaku, Y Sakakieda
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Development of a method to measure trace level of uranium and thorium in scintillation films
We have established a method to measure picograms-per-gram (pg g−1) levels of 238U and 232Th in scintillation films by combining the dry ashing method and inductively coupled plasma mass spectrometry. Trace amounts of 238U and 232Th were measured in up to 2 g of the scintillation film with almost 100% collection efficiency. This paper details the experimental procedure, including the pretreatment of the samples and labware, detection limit of the method, collection efficiencies of 238U and 232Th, and measurement of 238U and 232Th in a polyethylene naphthalate film. This method is also applicable to 238U and 232Th measurements in other low-background organic materials for rare event search experiments.
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