原子力显微镜中纳米级控制台的弯曲测试

IF 0.8 4区物理与天体物理 Q4 PHYSICS, APPLIED

Technical Physics Letters Pub Date : 2024-03-14 DOI:10.1134/s1063785023010078

A. V. Ankudinov, M. M. Khalisov

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引用次数: 0

摘要

摘要在原子力显微镜下测试了 MgNi2Si2O5(OH)4 纳米卷轴的杆和桥的弯曲情况。通过测试数据，我们分析了柱子或桥是如何固定的，并在计算纳米卷轴的杨氏模量时考虑了这一信息。将控制台和桥梁分别建模为三跨梁和悬挂控制台的弹性地基上的梁时，控制台的结果与桥梁的结果非常吻合。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Bending Test of Nanoscale Consoles in Atomic Force Microscope

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Bending Test of Nanoscale Consoles in Atomic Force Microscope

Abstract

Consoles and bridges of MgNi₂Si₂O₅(OH)₄ nanoscrolls were tested for bending in atomic force microscope. Using test data, we analyze how the consoles or bridges were fixed, and took this information into account when calculating the Young’s modulus of the nanoscrolls. The results on the consoles are in good agreement with the results on the bridges when modeling the latter as three-span beams, and the former as beams on an elastic foundation with a suspended console.

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来源期刊

Technical Physics Letters 物理-物理：应用

CiteScore

1.50

自引率

0.00%

发文量

审稿时长

2-4 weeks

期刊介绍： Technical Physics Letters is a companion journal to Technical Physics and offers rapid publication of developments in theoretical and experimental physics with potential technological applications. Recent emphasis has included many papers on gas lasers and on lasing in semiconductors, as well as many reports on high Tc superconductivity. The excellent coverage of plasma physics seen in the parent journal, Technical Physics, is also present here with quick communication of developments in theoretical and experimental work in all fields with probable technical applications. Topics covered are basic and applied physics; plasma physics; solid state physics; physical electronics; accelerators; microwave electron devices; holography.