透视集成电路元件的光学和电子互连

S. Lazarouk, V. P. Bondarenko, V. E. Borisenko, N. V. Gaponenko, G. G. Gorokh, A. Leshok, D. Migas, E. B. Chubenko
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引用次数: 0

摘要

本文概述了白俄罗斯国立信息学和无线电电子学大学微电子学和纳米电子学系各研究单位在硅集成电路片内和片间光学和电子互连透视开发领域的最新研究成果。介绍了使用纳米结构材料制作光源和探测器(硅)以及与单晶硅集成的导光板(Al2O3/TiO2)的实例。推广并测试了在集成电路体(2.5D 和 3D )封装中应用芯片间插层进行光学和电子连接的策略。展示了有望用于光源、光学透明导电体和微波电磁辐射保护器的新型材料和结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Perspective Optical and Electronic Interconnects of Integrated Circuit Elements
The recent results of the investigations performed in the research units of the Department of Micro- and Nanoelectronics of Belarusian State University of Informatics and Radioelectronics in the field of the development of perspective optical and electronic intra-chip and inter-chip interconnections of silicon integrated circuits are summarized. Examples of the use of nanostructured materials for the proposed light sources and detectors (Si) as well as light guides (Al2O3/TiO2) integrated with monocrystalline silicon are presented. The strategy of an application of inter-chip interposers for optical and electronic connections in bulk (2.5D and 3D) packages of integrated circuits was promoted and tested. Novel materials and structures promising for light sources, optically transparent electrical conductors and protectors against microwave electromagnetic radiation are demonstrated.
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