旋转扫描模式下共面阵列电容成像的优化策略

{"title":"旋转扫描模式下共面阵列电容成像的优化策略","authors":"Yuyan Zhang, Hongyang Li, Yintang Wen, Zhao Pan, R. Li","doi":"10.1080/10589759.2024.2344690","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":508643,"journal":{"name":"Nondestructive Testing and Evaluation","volume":"125 18","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optimisation strategy for coplanar array capacitance imaging in rotational scanning mode\",\"authors\":\"Yuyan Zhang, Hongyang Li, Yintang Wen, Zhao Pan, R. Li\",\"doi\":\"10.1080/10589759.2024.2344690\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":508643,\"journal\":{\"name\":\"Nondestructive Testing and Evaluation\",\"volume\":\"125 18\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-04-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nondestructive Testing and Evaluation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1080/10589759.2024.2344690\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nondestructive Testing and Evaluation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/10589759.2024.2344690","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}