Tamal Roy, Peter T. Brown, Douglas P. Shepherd, and Lisa V. Poulikakos
{"title":"利用多极共振元表面对结构照明显微镜进行空间波前整形 [特邀]","authors":"Tamal Roy, Peter T. Brown, Douglas P. Shepherd, and Lisa V. Poulikakos","doi":"10.1364/ome.520736","DOIUrl":null,"url":null,"abstract":"Structured illumination microscopy (SIM) achieves superresolution in fluorescence imaging through patterned illumination and computational image reconstruction, yet current methods require bulky, costly modulation optics and high-precision optical alignment, thus hindering the widespread implementation of SIM. To address this challenge, this work demonstrates how nano-optical metasurfaces, rationally designed to tailor the far-field optical wavefront at sub-wavelength dimensions, hold great potential as ultrathin, single-surface, all-optical wavefront modulators for SIM. We computationally demonstrate this principle with a multipolar-resonant metasurface composed of silicon nanostructures that generate versatile optical wavefronts in the far field upon variation of the polarization or angle of incident light. Algorithmic optimization is performed to identify the seven most suitable illumination patterns for SIM generated by the metasurface based on three key criteria. We quantitatively demonstrate that multipolar-resonant metasurface SIM (mrm-SIM) achieves resolution gain that is comparable to conventional methods by applying the seven optimal metasurface-generated wavefronts to simulated fluorescent objects and reconstructing the objects using proximal gradient descent. Notably, we show that mrm-SIM achieves these resolution gains with a far-field illumination pattern that circumvents complex equipment and alignment requirements of comparable methodologies. The work presented here paves the way for a metasurface-enabled experimental simplification of structured illumination microscopy.","PeriodicalId":19548,"journal":{"name":"Optical Materials Express","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Spatial wavefront shaping with a multipolar-resonant metasurface for structured illumination microscopy [Invited]\",\"authors\":\"Tamal Roy, Peter T. Brown, Douglas P. Shepherd, and Lisa V. Poulikakos\",\"doi\":\"10.1364/ome.520736\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Structured illumination microscopy (SIM) achieves superresolution in fluorescence imaging through patterned illumination and computational image reconstruction, yet current methods require bulky, costly modulation optics and high-precision optical alignment, thus hindering the widespread implementation of SIM. To address this challenge, this work demonstrates how nano-optical metasurfaces, rationally designed to tailor the far-field optical wavefront at sub-wavelength dimensions, hold great potential as ultrathin, single-surface, all-optical wavefront modulators for SIM. We computationally demonstrate this principle with a multipolar-resonant metasurface composed of silicon nanostructures that generate versatile optical wavefronts in the far field upon variation of the polarization or angle of incident light. Algorithmic optimization is performed to identify the seven most suitable illumination patterns for SIM generated by the metasurface based on three key criteria. We quantitatively demonstrate that multipolar-resonant metasurface SIM (mrm-SIM) achieves resolution gain that is comparable to conventional methods by applying the seven optimal metasurface-generated wavefronts to simulated fluorescent objects and reconstructing the objects using proximal gradient descent. Notably, we show that mrm-SIM achieves these resolution gains with a far-field illumination pattern that circumvents complex equipment and alignment requirements of comparable methodologies. The work presented here paves the way for a metasurface-enabled experimental simplification of structured illumination microscopy.\",\"PeriodicalId\":19548,\"journal\":{\"name\":\"Optical Materials Express\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-04-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Materials Express\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1364/ome.520736\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Materials Express","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1364/ome.520736","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Spatial wavefront shaping with a multipolar-resonant metasurface for structured illumination microscopy [Invited]
Structured illumination microscopy (SIM) achieves superresolution in fluorescence imaging through patterned illumination and computational image reconstruction, yet current methods require bulky, costly modulation optics and high-precision optical alignment, thus hindering the widespread implementation of SIM. To address this challenge, this work demonstrates how nano-optical metasurfaces, rationally designed to tailor the far-field optical wavefront at sub-wavelength dimensions, hold great potential as ultrathin, single-surface, all-optical wavefront modulators for SIM. We computationally demonstrate this principle with a multipolar-resonant metasurface composed of silicon nanostructures that generate versatile optical wavefronts in the far field upon variation of the polarization or angle of incident light. Algorithmic optimization is performed to identify the seven most suitable illumination patterns for SIM generated by the metasurface based on three key criteria. We quantitatively demonstrate that multipolar-resonant metasurface SIM (mrm-SIM) achieves resolution gain that is comparable to conventional methods by applying the seven optimal metasurface-generated wavefronts to simulated fluorescent objects and reconstructing the objects using proximal gradient descent. Notably, we show that mrm-SIM achieves these resolution gains with a far-field illumination pattern that circumvents complex equipment and alignment requirements of comparable methodologies. The work presented here paves the way for a metasurface-enabled experimental simplification of structured illumination microscopy.
期刊介绍:
The Optical Society (OSA) publishes high-quality, peer-reviewed articles in its portfolio of journals, which serve the full breadth of the optics and photonics community.
Optical Materials Express (OMEx), OSA''s open-access, rapid-review journal, primarily emphasizes advances in both conventional and novel optical materials, their properties, theory and modeling, synthesis and fabrication approaches for optics and photonics; how such materials contribute to novel optical behavior; and how they enable new or improved optical devices. The journal covers a full range of topics, including, but not limited to:
Artificially engineered optical structures
Biomaterials
Optical detector materials
Optical storage media
Materials for integrated optics
Nonlinear optical materials
Laser materials
Metamaterials
Nanomaterials
Organics and polymers
Soft materials
IR materials
Materials for fiber optics
Hybrid technologies
Materials for quantum photonics
Optical Materials Express considers original research articles, feature issue contributions, invited reviews, and comments on published articles. The Journal also publishes occasional short, timely opinion articles from experts and thought-leaders in the field on current or emerging topic areas that are generating significant interest.