{"title":"1375 ℃条件下不同氧分压下β-Ga2O3单晶中的氧扩散","authors":"Johanna Uhlendorf, Harald Schmidt","doi":"10.1515/znb-2023-0091","DOIUrl":null,"url":null,"abstract":"The monoclinic <jats:italic>β</jats:italic>-polymorph of gallium oxide is a semiconductor with an ultra-wide bandgap. It is becoming increasingly significant for various technological applications. We have investigated the tracer self-diffusion of oxygen in <jats:italic>β</jats:italic>-Ga<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> single crystals as a function of the oxygen partial pressure (2, 20 and 200 mbar) at a temperature of 1375 °C. Isotopically enriched <jats:sup>18</jats:sup>O<jats:sub>2</jats:sub> gas was used as a tracer source and secondary ion mass spectrometry to analyze depth profiles. We observed that, with decreasing oxygen partial pressure, the diffusivities at a given temperature increase significantly. We suggest that this behaviour can be explained by a change in the diffusion mechanism from oxygen interstitials to oxygen vacancies.","PeriodicalId":23831,"journal":{"name":"Zeitschrift für Naturforschung B","volume":"92 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-04-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Oxygen diffusion in β-Ga2O3 single crystals under different oxygen partial pressures at 1375 °C\",\"authors\":\"Johanna Uhlendorf, Harald Schmidt\",\"doi\":\"10.1515/znb-2023-0091\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The monoclinic <jats:italic>β</jats:italic>-polymorph of gallium oxide is a semiconductor with an ultra-wide bandgap. It is becoming increasingly significant for various technological applications. We have investigated the tracer self-diffusion of oxygen in <jats:italic>β</jats:italic>-Ga<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> single crystals as a function of the oxygen partial pressure (2, 20 and 200 mbar) at a temperature of 1375 °C. Isotopically enriched <jats:sup>18</jats:sup>O<jats:sub>2</jats:sub> gas was used as a tracer source and secondary ion mass spectrometry to analyze depth profiles. We observed that, with decreasing oxygen partial pressure, the diffusivities at a given temperature increase significantly. We suggest that this behaviour can be explained by a change in the diffusion mechanism from oxygen interstitials to oxygen vacancies.\",\"PeriodicalId\":23831,\"journal\":{\"name\":\"Zeitschrift für Naturforschung B\",\"volume\":\"92 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-04-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Zeitschrift für Naturforschung B\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1515/znb-2023-0091\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Zeitschrift für Naturforschung B","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/znb-2023-0091","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
氧化镓的单斜β多晶体是一种具有超宽带隙的半导体。它在各种技术应用中的重要性与日俱增。我们研究了在 1375 °C 温度下,β-Ga2O3 单晶中氧的示踪自扩散与氧分压(2、20 和 200 毫巴)的函数关系。使用同位素富集的 18O2 气体作为示踪源,并使用二次离子质谱分析深度剖面。我们观察到,随着氧分压的降低,特定温度下的扩散率显著增加。我们认为,这种行为可以用从氧间隙到氧空位的扩散机制变化来解释。
Oxygen diffusion in β-Ga2O3 single crystals under different oxygen partial pressures at 1375 °C
The monoclinic β-polymorph of gallium oxide is a semiconductor with an ultra-wide bandgap. It is becoming increasingly significant for various technological applications. We have investigated the tracer self-diffusion of oxygen in β-Ga2O3 single crystals as a function of the oxygen partial pressure (2, 20 and 200 mbar) at a temperature of 1375 °C. Isotopically enriched 18O2 gas was used as a tracer source and secondary ion mass spectrometry to analyze depth profiles. We observed that, with decreasing oxygen partial pressure, the diffusivities at a given temperature increase significantly. We suggest that this behaviour can be explained by a change in the diffusion mechanism from oxygen interstitials to oxygen vacancies.