利用辐射加固型光学可重构门阵列进行快速中子软容错实验

2024 IEEE International Conference on Consumer Electronics (ICCE) Pub Date : 2024-01-06 DOI:10.1109/ICCE59016.2024.10444280

Minoru Watanabe, M. Kobayashi, Mitsutaka Isobe, Kunihiro Ogawa, S. Matsuyama, M. Miwa

{"title":"利用辐射加固型光学可重构门阵列进行快速中子软容错实验","authors":"Minoru Watanabe, M. Kobayashi, Mitsutaka Isobe, Kunihiro Ogawa, S. Matsuyama, M. Miwa","doi":"10.1109/ICCE59016.2024.10444280","DOIUrl":null,"url":null,"abstract":"Nuclear power plants and their decommissioning operations require radiation-hardened devices that are robust against neutron because recriticality might happen while doing decommissioning tasks. To realize devices able to withstand such environments, optically reconfigurable gate arrays have been developed. This paper presents radiation tolerance experiment results obtained for a radiation-hardened optically reconfigurable gate array using a fast-neutron beam.","PeriodicalId":518694,"journal":{"name":"2024 IEEE International Conference on Consumer Electronics (ICCE)","volume":"70 10","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2024-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fast-neutron soft-error tolerance experimentation with a radiation-hardened optically reconfigurable gate array\",\"authors\":\"Minoru Watanabe, M. Kobayashi, Mitsutaka Isobe, Kunihiro Ogawa, S. Matsuyama, M. Miwa\",\"doi\":\"10.1109/ICCE59016.2024.10444280\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Nuclear power plants and their decommissioning operations require radiation-hardened devices that are robust against neutron because recriticality might happen while doing decommissioning tasks. To realize devices able to withstand such environments, optically reconfigurable gate arrays have been developed. This paper presents radiation tolerance experiment results obtained for a radiation-hardened optically reconfigurable gate array using a fast-neutron beam.\",\"PeriodicalId\":518694,\"journal\":{\"name\":\"2024 IEEE International Conference on Consumer Electronics (ICCE)\",\"volume\":\"70 10\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-01-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2024 IEEE International Conference on Consumer Electronics (ICCE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCE59016.2024.10444280\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2024 IEEE International Conference on Consumer Electronics (ICCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCE59016.2024.10444280","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

核电站及其退役工作需要能抵御中子辐射的抗辐射设备，因为在执行退役任务时可能会发生再临界状态。为了实现能够承受这种环境的设备，人们开发了光学可重构门阵列。本文介绍了使用快速中子束对光学可重构门阵列进行辐射耐受性实验所获得的结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Fast-neutron soft-error tolerance experimentation with a radiation-hardened optically reconfigurable gate array

Nuclear power plants and their decommissioning operations require radiation-hardened devices that are robust against neutron because recriticality might happen while doing decommissioning tasks. To realize devices able to withstand such environments, optically reconfigurable gate arrays have been developed. This paper presents radiation tolerance experiment results obtained for a radiation-hardened optically reconfigurable gate array using a fast-neutron beam.

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来源期刊

2024 IEEE International Conference on Consumer Electronics (ICCE)

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