{"title":"小型阵列系统中信号处理设备的在线监测和预测技术研究","authors":"S. He, Linlin Shi","doi":"10.1109/ICPECA60615.2024.10471011","DOIUrl":null,"url":null,"abstract":"This article focuses on the problem of fault monitoring and diagnosis in small array systems. We analyzed the composition of the small array system and BIT settings, and proposed a modeling sensitive parameter set for system health management. Based on the fault sensitive parameter set, we provide a feature processing method and process for sensitive parameters. We use machine learning classification methods and time series methods to diagnose and predict faults in small array systems, respectively, achieving high classification and prediction accuracy. The data analysis results indicate that using data-driven small array systems for monitoring and prediction has good engineering application prospects.","PeriodicalId":518671,"journal":{"name":"2024 IEEE 4th International Conference on Power, Electronics and Computer Applications (ICPECA)","volume":"45 10","pages":"8-12"},"PeriodicalIF":0.0000,"publicationDate":"2024-01-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Research on Online Monitoring and Prediction Technology of Signal Processing Devices in Small Array Systems\",\"authors\":\"S. He, Linlin Shi\",\"doi\":\"10.1109/ICPECA60615.2024.10471011\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article focuses on the problem of fault monitoring and diagnosis in small array systems. We analyzed the composition of the small array system and BIT settings, and proposed a modeling sensitive parameter set for system health management. Based on the fault sensitive parameter set, we provide a feature processing method and process for sensitive parameters. We use machine learning classification methods and time series methods to diagnose and predict faults in small array systems, respectively, achieving high classification and prediction accuracy. The data analysis results indicate that using data-driven small array systems for monitoring and prediction has good engineering application prospects.\",\"PeriodicalId\":518671,\"journal\":{\"name\":\"2024 IEEE 4th International Conference on Power, Electronics and Computer Applications (ICPECA)\",\"volume\":\"45 10\",\"pages\":\"8-12\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-01-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2024 IEEE 4th International Conference on Power, Electronics and Computer Applications (ICPECA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICPECA60615.2024.10471011\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2024 IEEE 4th International Conference on Power, Electronics and Computer Applications (ICPECA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPECA60615.2024.10471011","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
本文重点讨论了小型阵列系统的故障监测和诊断问题。我们分析了小型阵列系统的组成和 BIT 设置,提出了用于系统健康管理的建模敏感参数集。基于故障敏感参数集,我们提供了敏感参数的特征处理方法和流程。我们利用机器学习分类方法和时间序列方法分别对小型阵列系统进行故障诊断和预测,取得了较高的分类和预测精度。数据分析结果表明,利用数据驱动的小型阵列系统进行监测和预测具有良好的工程应用前景。
Research on Online Monitoring and Prediction Technology of Signal Processing Devices in Small Array Systems
This article focuses on the problem of fault monitoring and diagnosis in small array systems. We analyzed the composition of the small array system and BIT settings, and proposed a modeling sensitive parameter set for system health management. Based on the fault sensitive parameter set, we provide a feature processing method and process for sensitive parameters. We use machine learning classification methods and time series methods to diagnose and predict faults in small array systems, respectively, achieving high classification and prediction accuracy. The data analysis results indicate that using data-driven small array systems for monitoring and prediction has good engineering application prospects.