基于 DBSCAN 算法的磁近场辐射发射模式聚类方法

IF 1.4 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Bo Hou, Rui Ding, Weiheng Shao, Siyang Liu, Liwei Wang
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引用次数: 0

摘要

近来,在设备级电磁兼容性测试中,磁场近场辐射发射(MNRE)分析受到越来越多的关注。由于 MNRE 具有频率、空间位置、发射强度等多维特征,人工对集成电路的 MNRE 进行模式聚类非常耗时。本文提出了一种新颖的 MNRE 模式聚类方法,包括强发射频率提取、特征提取和基于密度的聚类。在采用 256 Ball Grid Array 封装的现场可编程门阵列上设计了环形振荡器和五个工作状态,并利用它们创建了一个复杂的多源发射案例,以验证聚类方法的有效性。验证结果表明,所提出的方法能正确聚类多源发射模式。此外,该方法还应用于工作状态未知的微控制器单元;结果表明,所提出的方法也能有效区分未知发射模式,并定位未知干扰源。三维 X 射线显微镜检测证明了干扰源定位的准确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Pattern clustering method of magnetic near-field radiation emissions based on DBSCAN algorithm

Pattern clustering method of magnetic near-field radiation emissions based on DBSCAN algorithm

The analysis of magnetic near-field radiation emissions (MNRE) has recently raised more attention in device-level electromagnetic compatibility testing. Pattern clustering of MNRE for integrated circuits manually is very time-consuming because of the multi-dimensional characteristics of MNRE, such as frequency, spatial position, emission intensity, etc. This paper proposes a novel pattern clustering method of MNRE, including strong emission frequency extraction, feature extraction, and density-based clustering. Ring oscillator and five working states are designed on a Field Programmable Gate Array with 256 Ball Grid Array package, which are used to create a complex multi-source emission case for verifying the effectiveness of the clustering method. The verification results show that the proposed method can correctly cluster the multi-source emission patterns. Further, the method is also applied to a Microcontroller Unit with unknown operating states; the results show that the proposed method also can effectively distinguish the unknown emission patterns and locate the unknown interference source. The accuracy of the interference source location is proven by 3D X-ray microscope inspection.

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来源期刊
Iet Science Measurement & Technology
Iet Science Measurement & Technology 工程技术-工程:电子与电气
CiteScore
4.30
自引率
7.10%
发文量
41
审稿时长
7.5 months
期刊介绍: IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation.The emphasis of the journal is on theory, simulation methodologies and measurement techniques. The major themes of the journal are: - electromagnetism including electromagnetic theory, computational electromagnetics and EMC - properties and applications of dielectric, magnetic, magneto-optic, piezoelectric materials down to the nanometre scale - measurement and instrumentation including sensors, actuators, medical instrumentation, fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration Applications are welcome for illustrative purposes but the novelty and originality should focus on the proposed new methods.
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