Salman Khan, Zainab Ali, Khadija Rehman, Massab Junaid
{"title":"弥散键合铜镍合金接合界面的机械和微结构表征","authors":"Salman Khan, Zainab Ali, Khadija Rehman, Massab Junaid","doi":"10.4028/p-k8wuuo","DOIUrl":null,"url":null,"abstract":"Solid-state diffusion bonding effectively joins dissimilar materials, even with varying metallurgical properties and melting points. In this study, a Cu/Ni joint was produced at a bonding temperature of 950°C for 60 minutes under a vacuum. The microstructural and mechanical properties of the bonding interface were evaluated using scanning electron microscopy (SEM) equipped with energy-dispersive spectroscopy (EDS), microhardness tests, and X-ray diffraction (XRD). It was found that the EDS point scan analysis revealed the formation of a solid solution of Cu-Ni at the bonding interface. Since Cu-Ni exhibit complete solubility with each other, no intermetallic compounds (IMCs) were formed. The microhardness indicated that the bonding interface had a microhardness of 20% and 54% higher than the base metals (BM) of Ni and Cu, respectively.","PeriodicalId":7271,"journal":{"name":"Advanced Materials Research","volume":"281 ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Mechanical and Microstructural Characterization of Diffusion-Bonded Copper-Nickel Joint Interface\",\"authors\":\"Salman Khan, Zainab Ali, Khadija Rehman, Massab Junaid\",\"doi\":\"10.4028/p-k8wuuo\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Solid-state diffusion bonding effectively joins dissimilar materials, even with varying metallurgical properties and melting points. In this study, a Cu/Ni joint was produced at a bonding temperature of 950°C for 60 minutes under a vacuum. The microstructural and mechanical properties of the bonding interface were evaluated using scanning electron microscopy (SEM) equipped with energy-dispersive spectroscopy (EDS), microhardness tests, and X-ray diffraction (XRD). It was found that the EDS point scan analysis revealed the formation of a solid solution of Cu-Ni at the bonding interface. Since Cu-Ni exhibit complete solubility with each other, no intermetallic compounds (IMCs) were formed. The microhardness indicated that the bonding interface had a microhardness of 20% and 54% higher than the base metals (BM) of Ni and Cu, respectively.\",\"PeriodicalId\":7271,\"journal\":{\"name\":\"Advanced Materials Research\",\"volume\":\"281 \",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-01-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Materials Research\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.4028/p-k8wuuo\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Materials Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4028/p-k8wuuo","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Mechanical and Microstructural Characterization of Diffusion-Bonded Copper-Nickel Joint Interface
Solid-state diffusion bonding effectively joins dissimilar materials, even with varying metallurgical properties and melting points. In this study, a Cu/Ni joint was produced at a bonding temperature of 950°C for 60 minutes under a vacuum. The microstructural and mechanical properties of the bonding interface were evaluated using scanning electron microscopy (SEM) equipped with energy-dispersive spectroscopy (EDS), microhardness tests, and X-ray diffraction (XRD). It was found that the EDS point scan analysis revealed the formation of a solid solution of Cu-Ni at the bonding interface. Since Cu-Ni exhibit complete solubility with each other, no intermetallic compounds (IMCs) were formed. The microhardness indicated that the bonding interface had a microhardness of 20% and 54% higher than the base metals (BM) of Ni and Cu, respectively.