核科学与技术研究所 SSDL 参考 X 射线窄谱系列的特征

Thi My Linh Dang, Ngoc Quynh Nguyen, Duc-Ky Bui, Thi Nhung Duong, Quang Tuan Ho, Van Trieu Duong, Thanh Ha Tran, Thi Anh Duong Bui, Bao Ngoc Pham
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摘要

本文介绍了核科学与技术研究所二级标准剂量测定实验室(SSDL)使用的 X 射线束辐照装置的参考 X 射线窄谱系列的特性。为了进行校准工作,验证国际标准化组织(ISO)4037:2019 推荐的参考 X 射线束的特性和质量非常重要。针对 40 和 150 千伏范围内的窄光谱系列,确定了 X 射线束在半值层、均匀性系数和空气开玛率方面的特性。同时还测定了相关的剂量测定量,如环境剂量当量和个人剂量当量。实验值与 ISO 4037 标准的推荐值完全一致。这意味着参考 X 射线窄谱系列(N 系列)可用于辐射安全评估中 X 射线测量设备的校准工作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Characteristics of the reference X-ray narrow-spectrum series at SSDL of Institute for Nuclear Science and Technology
This paper presents the characteristics of the reference X-ray narrow-spectrum series used in the Secondary Standard Dosimetry Laboratory (SSDL) at Institute for Nuclear Science and Technology (INST) with X-ray beam irradiator. In order to perform calibration works, it is highly important to verify the characteristics and qualities of reference X-ray beam recommended by the International Standardization Organization (ISO) 4037:2019. The characteristics of the X-ray beams in terms of the half-value layer, homogeneity coefficient and the air kerma rate are determined for the narrow-spectrum series in the 40 and 150 keV range. The related dosimetric quantities such as the ambient dose equivalent and personal dose equivalent also determined. The experimental values are well consistent with the recommended values of the ISO 4037 criteria. It implies that the reference X-ray narrow-spectrum series (N-series) can be applied in calibration works of X-ray measuring devices used in radiation safety assessment.
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