基于 DNA 的 PN 二极管掺杂与制造

IF 4.1 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Ruobing Bai, Yihan Liu, Bomin Zhang, Beishan Chen, Feng Xiong, Haitao Liu
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引用次数: 0

摘要

本文报告了利用 DNA 纳米结构作为二氧化硅的蚀刻模板和硅的正掺杂剂制作硅 PN 二极管的过程。DNA 纳米管沉积在具有热 SiO2 层的 p 型硅晶片上。DNA 纳米管通过 HF 蒸汽催化 SiO2 的蚀刻,从而暴露出底层硅。DNA 纳米管中的磷酸基团被用作掺杂源,对硅晶片进行局部 n 掺杂,从而形成垂直 P-N 结。制作出的 PN 二极管原型具有预期的阻塞特性,其膝部电压约为 0.7 V。我们的工作凸显了 DNA 纳米技术在未来制造纳米电子器件中的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
DNA-based doping and fabrication of PN diodes
This paper reports the fabrication of silicon PN diode by using DNA nanostructure as the etching template for SiO2 and also as the n-dopant of Si. DNA nanotubes were deposited onto p-type silicon wafer that has a thermal SiO2 layer. The DNA nanotubes catalyze the etching of SiO2 by HF vapor to expose the underlying Si. The phosphate groups in the DNA nanotube were used as the doping source to locally n-dope the Si wafer to form vertical P-N junctions. Prototype PN diodes were fabricated and exhibited expected blockage behavior with a knee voltage of ca. 0.7 V. Our work highlights the potential of DNA nanotechnology in future fabrication of nanoelectronics.
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来源期刊
Frontiers in Nanotechnology
Frontiers in Nanotechnology Engineering-Electrical and Electronic Engineering
CiteScore
7.10
自引率
0.00%
发文量
96
审稿时长
13 weeks
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