Halil Arslan, Alexei Kuzmin, I. Aulika, D. Moldarev, M. Wolff, D. Primetzhofer, I. Pudza, Karlis Kundzins, A. Sarakovskis, J. Purāns, Smagul Karazhanov
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引用次数: 0
摘要
我们研究了电子束蒸发法生产的光致变色氢化钇薄膜结构中钇的有效氧化态和局部环境,以及它们的化学结构和光学特性。透射电子显微镜图像显示氧化氢化钇薄膜样品呈现三层结构。X 射线光电子能谱(XPS)测量结果表明,钇的氧化态发生了改变,这取决于薄膜的成分/深度。此外,离子束分析证实,这种变化与薄膜内的成分梯度有关。Y K 边的 X 射线吸收光谱显示,在 YHO 的透明/漂白状态下,钇的有效氧化态约为 +2.5。光谱椭偏仪研究显示,相关样品具有复杂的非线性光学深度剖面,证实了 YHO 的主要相位以及 Y2O3 和 Y 在薄膜中部的存在。报告首次证明了电子束溅射光致变色 YHO 薄膜在透明和黑暗状态下的(n; k)色散曲线。
Chemical state and atomic structure in stoichiovariants photochromic oxidized yttrium hydride thin films
We investigate the effective oxidation state and local environment of yttrium in photochromic YHO thin film structures produced by e-beam evaporation, along with their chemical structure and optical properties. Transmission electron microscopy images reveal the oxidized yttrium hydride thin film sample exhibiting a three-layered structure. X-ray photoelectron spectroscopy (XPS) measurements manifest that the oxidation state of yttrium is modified, dependent on the film’s composition/depth. Furthermore, Ion beam analysis confirms that this variability is associated with a composition gradient within the film. X-ray absorption spectroscopy at the Y K-edge reveals that the effective oxidation state of yttrium is approximately +2.5 in the transparent/bleached state of YHO. Spectroscopic ellipsometry investigations showed a complex non-linear optical depth profile of the related sample confirming the dominant phase of YHO and the presence of Y2O3 and Y towards the middle of the film. The first evidence of (n; k) dispersion curves for e-beam sputtered photochromic YHO thin films are reported for transparent and dark states.