全面回顾图像超分辨率指标:经典方法和基于人工智能的方法

Q3 Engineering
Mukhriddin Arabboev, Shohruh Begmatov, Mokhirjon Rikhsivoev, K. Nosirov, Saidakmal Saydiakbarov
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引用次数: 1

摘要

图像超分辨率是一个利用各种技术和算法提高图像质量和分辨率的过程。该过程旨在从给定的低分辨率输入重建高分辨率图像。要确定这些算法的有效性,使用特定指标对其进行评估至关重要。在本文中,我们将仔细研究最常用的图像超分辨率指标,包括均方误差 (MSE)、均方根误差 (RMSE)、峰值信噪比 (PSNR) 和结构相似性指数 (SSIM) 等经典方法。我们还讨论了学习感知图像补丁相似度(LPIPS)、弗雷谢特起始距离(FID)、起始分数(IS)和多尺度结构相似性指数(MS-SSIM)等高级指标。此外,我们还概述了经典的和基于人工智能的超分辨率技术和方法。最后,我们讨论了该领域的潜在挑战和未来研究方向,并通过应用图像超分辨率指标展示了我们的实验结果。在结果与讨论部分,我们实践了一些给定的指标,并提出了我们的图像超分辨率结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
comprehensive review of image super-resolution metrics: classical and AI-based approaches
Image super-resolution is a process that aims to enhance the quality and resolution of images using various techniques and algorithms. The process aims to reconstruct a high-resolution image from a given low-resolution input. To determine the effectiveness of these algorithms, it's crucial to evaluate those using specific metrics. In this paper, we take a closer look at the most commonly used image super-resolution metrics, including classical approaches like Mean Squared Error (MSE), Root Mean Squared Error (RMSE), Peak Signal to Noise Ratio (PSNR), and Structural Similarity Index (SSIM). We also discuss advanced metrics like Learned Perceptual Image Patch Similarity (LPIPS), Fréchet Inception Distance (FID), Inception Score (IS), and Multi-Scale Structural Similarity Index (MS-SSIM). Furthermore, we provide an overview of classical and AI-based super-resolution techniques and methods. Finally, we discuss potential challenges and future research directions in the field and present our experimental results by applying image super-resolution metrics. In the result and discussion section, we have practiced some given metrics and proposed our image super-resolution results.
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来源期刊
Acta IMEKO
Acta IMEKO Engineering-Mechanical Engineering
CiteScore
2.50
自引率
0.00%
发文量
75
期刊介绍: The main goal of this journal is the enhancement of academic activities of IMEKO and a wider dissemination of scientific output from IMEKO TC events. High-quality papers presented at IMEKO conferences, workshops or congresses are seleted by the event organizers and the authors are invited to publish an enhanced version of their paper in this journal. The journal also publishes scientific articles on measurement and instrumentation not related to an IMEKO event.
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