利用电子风力使老化的齐纳二极管恢复活力

M. Rahman, N. Al-Mamun, Nicholas Glavin, A. Haque, Fan Ren, S. Pearton, Douglas E. Wolfe
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引用次数: 0

摘要

在这项研究中,我们探讨了因高电应力而退化的齐纳二极管的年轻化问题,这种退化导致齐纳击穿电压膝部左移和拓宽,同时正向电流减少了 57%。我们采用了一种非热退火方法,包括短脉宽和低频率的高密度电脉冲。退火过程在近环境温度下耗时小于 30 秒。拉曼光谱支持电学表征,显示出结晶度的提高,从而解释了击穿膝部恢复以及正向电流提高约 85% 的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Rejuvenation of degraded Zener diodes with the electron wind force
In this study, we explore the rejuvenation of a Zener diode degraded by high electrical stress, leading to a leftward shift, and broadening of the Zener breakdown voltage knee, alongside a 57% reduction in forward current. We employed a non-thermal annealing method involving high-density electric pulses with short pulse width and low frequency. The annealing process took < 30 seconds at near-ambient temperature. Raman spectroscopy supports the electrical characterization, showing enhancement in crystallinity to explain the restoration of the breakdown knee followed by improvement in forward current by ~ 85%.
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