图像质量评估:利用机器学习模型评估实际图像的图像质量

Q2 Mathematics
Shiva Shankar Reddy, V. R. Maheswara Rao, Kalidindi Sravani, Silpa Nrusimhadri
{"title":"图像质量评估:利用机器学习模型评估实际图像的图像质量","authors":"Shiva Shankar Reddy, V. R. Maheswara Rao, Kalidindi Sravani, Silpa Nrusimhadri","doi":"10.11591/eei.v13i2.5947","DOIUrl":null,"url":null,"abstract":"Evaluating image features is a significant step in image processing in applications like number plate detection, vehicle tracking and many image processing-based applications. Image processing-based applications need accurate parts to get the best outcomes. Feature detection is done based on various feature detection techniques. The proposed system aims to get the best feature detector based on the input images by evaluating the image features. For assessing the image features, the proposed system worked on various descriptors like oriented FAST and rotated brief (ORB), learned arrangements of three patch codes (LATCH), binary robust independent elementary features (BRIEF), and binary robust invariant scalable keypoints (BRISK) to extract and evaluate the features using K-nearest neighbor (KNN)-matching and retrieve the inliers of the matching. Each descriptor produces different matching features and inliers; with the matchings and inliers, the inlier ratio calculates to show the analysis. To increase performance, we also examine adding depth information to descriptors.","PeriodicalId":37619,"journal":{"name":"Bulletin of Electrical Engineering and Informatics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Image quality evaluation: evaluation of the image quality of actual images by using machine learning models\",\"authors\":\"Shiva Shankar Reddy, V. R. Maheswara Rao, Kalidindi Sravani, Silpa Nrusimhadri\",\"doi\":\"10.11591/eei.v13i2.5947\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Evaluating image features is a significant step in image processing in applications like number plate detection, vehicle tracking and many image processing-based applications. Image processing-based applications need accurate parts to get the best outcomes. Feature detection is done based on various feature detection techniques. The proposed system aims to get the best feature detector based on the input images by evaluating the image features. For assessing the image features, the proposed system worked on various descriptors like oriented FAST and rotated brief (ORB), learned arrangements of three patch codes (LATCH), binary robust independent elementary features (BRIEF), and binary robust invariant scalable keypoints (BRISK) to extract and evaluate the features using K-nearest neighbor (KNN)-matching and retrieve the inliers of the matching. Each descriptor produces different matching features and inliers; with the matchings and inliers, the inlier ratio calculates to show the analysis. To increase performance, we also examine adding depth information to descriptors.\",\"PeriodicalId\":37619,\"journal\":{\"name\":\"Bulletin of Electrical Engineering and Informatics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Bulletin of Electrical Engineering and Informatics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.11591/eei.v13i2.5947\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"Mathematics\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Bulletin of Electrical Engineering and Informatics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.11591/eei.v13i2.5947","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Mathematics","Score":null,"Total":0}
引用次数: 0

摘要

在车牌检测、车辆跟踪和许多基于图像处理的应用中,评估图像特征是图像处理的一个重要步骤。基于图像处理的应用需要精确的部件才能获得最佳结果。特征检测是基于各种特征检测技术完成的。所提出的系统旨在通过评估图像特征,根据输入图像获得最佳特征检测器。为了评估图像特征,所提出的系统使用了各种描述符,如定向 FAST 和旋转简图(ORB)、三个补丁代码的学习排列(LATCH)、二进制鲁棒独立基本特征(BRIEF)和二进制鲁棒不变可扩展关键点(BRISK),使用 K 近邻(KNN)匹配来提取和评估特征,并检索匹配的离群值。每个描述符都会产生不同的匹配特征和离群值;利用匹配和离群值计算离群值比率,以显示分析结果。为了提高性能,我们还研究了在描述符中添加深度信息。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Image quality evaluation: evaluation of the image quality of actual images by using machine learning models
Evaluating image features is a significant step in image processing in applications like number plate detection, vehicle tracking and many image processing-based applications. Image processing-based applications need accurate parts to get the best outcomes. Feature detection is done based on various feature detection techniques. The proposed system aims to get the best feature detector based on the input images by evaluating the image features. For assessing the image features, the proposed system worked on various descriptors like oriented FAST and rotated brief (ORB), learned arrangements of three patch codes (LATCH), binary robust independent elementary features (BRIEF), and binary robust invariant scalable keypoints (BRISK) to extract and evaluate the features using K-nearest neighbor (KNN)-matching and retrieve the inliers of the matching. Each descriptor produces different matching features and inliers; with the matchings and inliers, the inlier ratio calculates to show the analysis. To increase performance, we also examine adding depth information to descriptors.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Bulletin of Electrical Engineering and Informatics
Bulletin of Electrical Engineering and Informatics Computer Science-Computer Science (miscellaneous)
CiteScore
3.60
自引率
0.00%
发文量
0
期刊介绍: Bulletin of Electrical Engineering and Informatics publishes original papers in the field of electrical, computer and informatics engineering which covers, but not limited to, the following scope: Computer Science, Computer Engineering and Informatics[...] Electronics[...] Electrical and Power Engineering[...] Telecommunication and Information Technology[...]Instrumentation and Control Engineering[...]
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信