粘结双材料中 V 型缺口/裂纹结构应力场的扩展边界元分析

IF 0.9 4区 材料科学 Q4 MATERIALS SCIENCE, MULTIDISCIPLINARY
Cong Li, Bin Hu, Zhongrong Niu
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引用次数: 0

摘要

本文采用扩展边界元法(XBEM)计算了不同弹性模量比下粘结双材料中平面 V 型缺口/裂纹结构的整体位移和应力场。首先,将 V 型缺口/裂纹结构分为两部分,即缺口尖端周围的小区域和无尖端区域的外部区域。然后,将缺口尖端区域奇异应力场的渐近序列嵌入无应力奇异的外部区域的边界积分方程。数值实例显示了 XBEM 在获取粘接双材料中 V 型缺口/裂纹结构的整体位移和应力场方面的准确性和有效性。结果表明,粘结双材料中 V 型缺口/裂纹结构的缺口/裂纹尖端区域应选择合理的特征对。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The extended boundary element analysis of stress fields of V-notched/cracked structures in bonded bimaterials

The extended boundary element method (XBEM) is employed to calculate the whole displacement and stress fields of the plane V-notched/cracked structure in a bonded bimaterial under different elastic modulus ratios. Firstly, the V-notched/cracked structure is divided into two parts, which are a small region around the notch tip and the outer region without the tip region. Then, the asymptotic series of the singular stress fields in the notch tip region are embedded with the boundary integral equation for the outer region without stress singularity. Numerical examples show the accuracy and effectiveness of the XBEM for obtaining the whole displacement and stress fields of the V-notched/cracked structure in bonded bimaterials. It is demonstrated that the notch/crack tip region of the V-notched/cracked structure in bonded bimaterials should choose reasonable eigen-pairs.

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来源期刊
Journal of Mechanics of Materials and Structures
Journal of Mechanics of Materials and Structures 工程技术-材料科学:综合
CiteScore
1.40
自引率
0.00%
发文量
8
审稿时长
3.5 months
期刊介绍: Drawing from all areas of engineering, materials, and biology, the mechanics of solids, materials, and structures is experiencing considerable growth in directions not anticipated a few years ago, which involve the development of new technology requiring multidisciplinary simulation. The journal stimulates this growth by emphasizing fundamental advances that are relevant in dealing with problems of all length scales. Of growing interest are the multiscale problems with an interaction between small and large scale phenomena.
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