用于共封装光学应用的扩展光束连接器的高功率测试

{"title":"用于共封装光学应用的扩展光束连接器的高功率测试","authors":"Martin Hempstead, Riley S. Freeland, Stephen Q. Smith, Sean B. Treacy, Sharon Lutz, Sherri Dempsey, Arnold Deal, Tom Mitcheltree, Michael Kadar-Kallen, E. Timurdogan, Albert Benzoni","doi":"10.1117/12.3003234","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":517898,"journal":{"name":"Optical Interconnects XXIV","volume":"31 16","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-power tests of expanded beam connectors for co-packaged optics applications\",\"authors\":\"Martin Hempstead, Riley S. Freeland, Stephen Q. Smith, Sean B. Treacy, Sharon Lutz, Sherri Dempsey, Arnold Deal, Tom Mitcheltree, Michael Kadar-Kallen, E. Timurdogan, Albert Benzoni\",\"doi\":\"10.1117/12.3003234\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":517898,\"journal\":{\"name\":\"Optical Interconnects XXIV\",\"volume\":\"31 16\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-03-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Interconnects XXIV\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.3003234\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Interconnects XXIV","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.3003234","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}