Huy Tiep Nguyen , Chi Thanh Tran , Hoang Hung Nguyen , Thi Huong Giang Do , Duc Hai Tran , Viet Cuong Le
{"title":"在等离子体层下集成光电二极管的表面等离子体共振传感器","authors":"Huy Tiep Nguyen , Chi Thanh Tran , Hoang Hung Nguyen , Thi Huong Giang Do , Duc Hai Tran , Viet Cuong Le","doi":"10.1016/j.jsamd.2024.100711","DOIUrl":null,"url":null,"abstract":"<div><p>Surface plasmon resonance (SPR)-based sensors have demonstrated exceptional sensitivity in detecting changes in the refractive index (RI) occurring near the sensor surface due to variations in concentration within the medium, chemical reactions, analyte binding with its ligand, and similar factors. However, most conventional SPR sensors rely on an external photodiode system and a complex mechanical system to measure changes in both intensity and position of reflected light. This is the main limitation of typical SPR sensors, making them non-portable and challenging to apply in experiments beyond the laboratory. Here, we propose SPR sensor chips integrated with a photodiode that eliminates the disadvantage of conventional SPR sensors. The photodiode is based on an n-type Silicon (nSi)-intrinsic Silicon (iSi) junction, sandwiched between a transparent conductive oxide layer, specifically Indium Tin Oxide (ITO), and a plasmonic material, namely Gold (Au). The working principle of our photodiode-integrated SPR sensors was revealed, and the impact of nSi and iSi film thicknesses on sensor sensitivity was investigated. Our SPR sensors enhance the efficiency of SPR-based sensors across diverse applications and facilitate integration into completed electronic devices.</p></div>","PeriodicalId":17219,"journal":{"name":"Journal of Science: Advanced Materials and Devices","volume":null,"pages":null},"PeriodicalIF":6.7000,"publicationDate":"2024-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S246821792400042X/pdfft?md5=436edef4de58a44e205b69c805a632a4&pid=1-s2.0-S246821792400042X-main.pdf","citationCount":"0","resultStr":"{\"title\":\"Surface plasmon resonance sensor with photodiode integrated beneath plasmonic layer\",\"authors\":\"Huy Tiep Nguyen , Chi Thanh Tran , Hoang Hung Nguyen , Thi Huong Giang Do , Duc Hai Tran , Viet Cuong Le\",\"doi\":\"10.1016/j.jsamd.2024.100711\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Surface plasmon resonance (SPR)-based sensors have demonstrated exceptional sensitivity in detecting changes in the refractive index (RI) occurring near the sensor surface due to variations in concentration within the medium, chemical reactions, analyte binding with its ligand, and similar factors. However, most conventional SPR sensors rely on an external photodiode system and a complex mechanical system to measure changes in both intensity and position of reflected light. This is the main limitation of typical SPR sensors, making them non-portable and challenging to apply in experiments beyond the laboratory. Here, we propose SPR sensor chips integrated with a photodiode that eliminates the disadvantage of conventional SPR sensors. The photodiode is based on an n-type Silicon (nSi)-intrinsic Silicon (iSi) junction, sandwiched between a transparent conductive oxide layer, specifically Indium Tin Oxide (ITO), and a plasmonic material, namely Gold (Au). The working principle of our photodiode-integrated SPR sensors was revealed, and the impact of nSi and iSi film thicknesses on sensor sensitivity was investigated. Our SPR sensors enhance the efficiency of SPR-based sensors across diverse applications and facilitate integration into completed electronic devices.</p></div>\",\"PeriodicalId\":17219,\"journal\":{\"name\":\"Journal of Science: Advanced Materials and Devices\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":6.7000,\"publicationDate\":\"2024-03-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S246821792400042X/pdfft?md5=436edef4de58a44e205b69c805a632a4&pid=1-s2.0-S246821792400042X-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Science: Advanced Materials and Devices\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S246821792400042X\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Science: Advanced Materials and Devices","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S246821792400042X","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Surface plasmon resonance sensor with photodiode integrated beneath plasmonic layer
Surface plasmon resonance (SPR)-based sensors have demonstrated exceptional sensitivity in detecting changes in the refractive index (RI) occurring near the sensor surface due to variations in concentration within the medium, chemical reactions, analyte binding with its ligand, and similar factors. However, most conventional SPR sensors rely on an external photodiode system and a complex mechanical system to measure changes in both intensity and position of reflected light. This is the main limitation of typical SPR sensors, making them non-portable and challenging to apply in experiments beyond the laboratory. Here, we propose SPR sensor chips integrated with a photodiode that eliminates the disadvantage of conventional SPR sensors. The photodiode is based on an n-type Silicon (nSi)-intrinsic Silicon (iSi) junction, sandwiched between a transparent conductive oxide layer, specifically Indium Tin Oxide (ITO), and a plasmonic material, namely Gold (Au). The working principle of our photodiode-integrated SPR sensors was revealed, and the impact of nSi and iSi film thicknesses on sensor sensitivity was investigated. Our SPR sensors enhance the efficiency of SPR-based sensors across diverse applications and facilitate integration into completed electronic devices.
期刊介绍:
In 1985, the Journal of Science was founded as a platform for publishing national and international research papers across various disciplines, including natural sciences, technology, social sciences, and humanities. Over the years, the journal has experienced remarkable growth in terms of quality, size, and scope. Today, it encompasses a diverse range of publications dedicated to academic research.
Considering the rapid expansion of materials science, we are pleased to introduce the Journal of Science: Advanced Materials and Devices. This new addition to our journal series offers researchers an exciting opportunity to publish their work on all aspects of materials science and technology within the esteemed Journal of Science.
With this development, we aim to revolutionize the way research in materials science is expressed and organized, further strengthening our commitment to promoting outstanding research across various scientific and technological fields.