在等离子体层下集成光电二极管的表面等离子体共振传感器

IF 6.7 3区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Huy Tiep Nguyen , Chi Thanh Tran , Hoang Hung Nguyen , Thi Huong Giang Do , Duc Hai Tran , Viet Cuong Le
{"title":"在等离子体层下集成光电二极管的表面等离子体共振传感器","authors":"Huy Tiep Nguyen ,&nbsp;Chi Thanh Tran ,&nbsp;Hoang Hung Nguyen ,&nbsp;Thi Huong Giang Do ,&nbsp;Duc Hai Tran ,&nbsp;Viet Cuong Le","doi":"10.1016/j.jsamd.2024.100711","DOIUrl":null,"url":null,"abstract":"<div><p>Surface plasmon resonance (SPR)-based sensors have demonstrated exceptional sensitivity in detecting changes in the refractive index (RI) occurring near the sensor surface due to variations in concentration within the medium, chemical reactions, analyte binding with its ligand, and similar factors. However, most conventional SPR sensors rely on an external photodiode system and a complex mechanical system to measure changes in both intensity and position of reflected light. This is the main limitation of typical SPR sensors, making them non-portable and challenging to apply in experiments beyond the laboratory. Here, we propose SPR sensor chips integrated with a photodiode that eliminates the disadvantage of conventional SPR sensors. The photodiode is based on an n-type Silicon (nSi)-intrinsic Silicon (iSi) junction, sandwiched between a transparent conductive oxide layer, specifically Indium Tin Oxide (ITO), and a plasmonic material, namely Gold (Au). The working principle of our photodiode-integrated SPR sensors was revealed, and the impact of nSi and iSi film thicknesses on sensor sensitivity was investigated. Our SPR sensors enhance the efficiency of SPR-based sensors across diverse applications and facilitate integration into completed electronic devices.</p></div>","PeriodicalId":17219,"journal":{"name":"Journal of Science: Advanced Materials and Devices","volume":null,"pages":null},"PeriodicalIF":6.7000,"publicationDate":"2024-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S246821792400042X/pdfft?md5=436edef4de58a44e205b69c805a632a4&pid=1-s2.0-S246821792400042X-main.pdf","citationCount":"0","resultStr":"{\"title\":\"Surface plasmon resonance sensor with photodiode integrated beneath plasmonic layer\",\"authors\":\"Huy Tiep Nguyen ,&nbsp;Chi Thanh Tran ,&nbsp;Hoang Hung Nguyen ,&nbsp;Thi Huong Giang Do ,&nbsp;Duc Hai Tran ,&nbsp;Viet Cuong Le\",\"doi\":\"10.1016/j.jsamd.2024.100711\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Surface plasmon resonance (SPR)-based sensors have demonstrated exceptional sensitivity in detecting changes in the refractive index (RI) occurring near the sensor surface due to variations in concentration within the medium, chemical reactions, analyte binding with its ligand, and similar factors. However, most conventional SPR sensors rely on an external photodiode system and a complex mechanical system to measure changes in both intensity and position of reflected light. This is the main limitation of typical SPR sensors, making them non-portable and challenging to apply in experiments beyond the laboratory. Here, we propose SPR sensor chips integrated with a photodiode that eliminates the disadvantage of conventional SPR sensors. The photodiode is based on an n-type Silicon (nSi)-intrinsic Silicon (iSi) junction, sandwiched between a transparent conductive oxide layer, specifically Indium Tin Oxide (ITO), and a plasmonic material, namely Gold (Au). The working principle of our photodiode-integrated SPR sensors was revealed, and the impact of nSi and iSi film thicknesses on sensor sensitivity was investigated. Our SPR sensors enhance the efficiency of SPR-based sensors across diverse applications and facilitate integration into completed electronic devices.</p></div>\",\"PeriodicalId\":17219,\"journal\":{\"name\":\"Journal of Science: Advanced Materials and Devices\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":6.7000,\"publicationDate\":\"2024-03-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S246821792400042X/pdfft?md5=436edef4de58a44e205b69c805a632a4&pid=1-s2.0-S246821792400042X-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Science: Advanced Materials and Devices\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S246821792400042X\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Science: Advanced Materials and Devices","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S246821792400042X","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

基于表面等离子体共振(SPR)的传感器在检测传感器表面附近因介质浓度变化、化学反应、分析物与其配体结合以及类似因素引起的折射率(RI)变化方面表现出了超高的灵敏度。然而,大多数传统的 SPR 传感器都依赖于外部光电二极管系统和复杂的机械系统来测量反射光的强度和位置变化。这是典型 SPR 传感器的主要局限性,使其无法便携,难以应用于实验室以外的实验。在这里,我们提出了与光电二极管集成的 SPR 传感器芯片,它消除了传统 SPR 传感器的缺点。该光电二极管基于一个 n 型硅 (nSi) - 本征硅 (iSi) 结,夹在透明导电氧化层(特别是氧化铟锡 (ITO) )和等离子材料(即金 (Au) )之间。我们揭示了光电二极管集成 SPR 传感器的工作原理,并研究了 nSi 和 iSi 薄膜厚度对传感器灵敏度的影响。我们的 SPR 传感器提高了基于 SPR 的传感器在各种应用中的效率,并有助于集成到完整的电子设备中。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Surface plasmon resonance sensor with photodiode integrated beneath plasmonic layer

Surface plasmon resonance (SPR)-based sensors have demonstrated exceptional sensitivity in detecting changes in the refractive index (RI) occurring near the sensor surface due to variations in concentration within the medium, chemical reactions, analyte binding with its ligand, and similar factors. However, most conventional SPR sensors rely on an external photodiode system and a complex mechanical system to measure changes in both intensity and position of reflected light. This is the main limitation of typical SPR sensors, making them non-portable and challenging to apply in experiments beyond the laboratory. Here, we propose SPR sensor chips integrated with a photodiode that eliminates the disadvantage of conventional SPR sensors. The photodiode is based on an n-type Silicon (nSi)-intrinsic Silicon (iSi) junction, sandwiched between a transparent conductive oxide layer, specifically Indium Tin Oxide (ITO), and a plasmonic material, namely Gold (Au). The working principle of our photodiode-integrated SPR sensors was revealed, and the impact of nSi and iSi film thicknesses on sensor sensitivity was investigated. Our SPR sensors enhance the efficiency of SPR-based sensors across diverse applications and facilitate integration into completed electronic devices.

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来源期刊
Journal of Science: Advanced Materials and Devices
Journal of Science: Advanced Materials and Devices Materials Science-Electronic, Optical and Magnetic Materials
CiteScore
11.90
自引率
2.50%
发文量
88
审稿时长
47 days
期刊介绍: In 1985, the Journal of Science was founded as a platform for publishing national and international research papers across various disciplines, including natural sciences, technology, social sciences, and humanities. Over the years, the journal has experienced remarkable growth in terms of quality, size, and scope. Today, it encompasses a diverse range of publications dedicated to academic research. Considering the rapid expansion of materials science, we are pleased to introduce the Journal of Science: Advanced Materials and Devices. This new addition to our journal series offers researchers an exciting opportunity to publish their work on all aspects of materials science and technology within the esteemed Journal of Science. With this development, we aim to revolutionize the way research in materials science is expressed and organized, further strengthening our commitment to promoting outstanding research across various scientific and technological fields.
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