使用 FDDM/VF 预测穿孔导电外壳中 HPEM 波形与功率放大器的耦合情况

IF 1.4 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Ali Kalantarnia, Abdollah Mirzabeigi
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引用次数: 0

摘要

在高功率电磁(HPEM)环境中保护电子和电信系统的最常用方法之一是使用导电外壳。放大器是发射器和接收器系统中的重要部件,是电信系统的主要组件,因此研究 HPEM 波形对其性能的影响非常重要。导电外壳主体上的孔隙以及放大器中的晶体管等非线性元件增加了研究电磁场耦合对放大器性能影响的复杂性。考虑到这一课题的重要性,本研究调查了 HPEM 波形对导电外壳内功率放大器的影响。通过使用有限差分延迟建模(FDDM)数值方法作为稳定方法,再使用矢量拟合(VF)方法,将电磁问题转化为电路问题,从而可以研究功率放大器和任何电路(包括非线性元件)对干扰场的响应。利用所提出的方法计算的双极线性和非线性元件在穿孔导电外壳中的响应与计算机仿真技术微波工作室(CST-MWS)获得的结果进行了比较,以进行验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Predicting the coupling of HPEM waveform with a power amplifier in perforated conductive enclosure using FDDM/VF

Predicting the coupling of HPEM waveform with a power amplifier in perforated conductive enclosure using FDDM/VF

One of the most common methods to protect electronic and telecommunication systems in a high-power electromagnetic (HPEM) environment is using a conductive enclosure. Amplifiers are the vital parts in transmitter and receiver systems as the main components of a telecommunication system, so investigating the effects of HPEM waveform on their performance is very important. The Presence of apertures in the body of the conductive enclosure, as well as non-linear elements such as transistors in amplifiers, adds to the complexity of examining the coupling of electromagnetic fields on the performance of amplifiers. Considering the importance of the topic, in this study, the impact of the HPEM waveform on the power amplifier inside the conductive enclosure has been investigated. By using the finite difference delay modelling (FDDM) numerical method as a stable method followed by the vector fitting (VF) method, the electromagnetic problem has become a circuit problem, which allows examining the response of the power amplifier and any circuit, including non-linear elements against the interference field. Responses of bipolar linear and non-linear components in the perforated conductive enclosure by the proposed method have been compared with the results obtained by computer simulation technology microwave studio (CST-MWS) for verification.

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来源期刊
Iet Science Measurement & Technology
Iet Science Measurement & Technology 工程技术-工程:电子与电气
CiteScore
4.30
自引率
7.10%
发文量
41
审稿时长
7.5 months
期刊介绍: IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation.The emphasis of the journal is on theory, simulation methodologies and measurement techniques. The major themes of the journal are: - electromagnetism including electromagnetic theory, computational electromagnetics and EMC - properties and applications of dielectric, magnetic, magneto-optic, piezoelectric materials down to the nanometre scale - measurement and instrumentation including sensors, actuators, medical instrumentation, fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration Applications are welcome for illustrative purposes but the novelty and originality should focus on the proposed new methods.
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