基于多分形散射介质的高通量斑点光谱仪

IF 2.8 3区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Bhupesh Kumar, Yilin Zhu, Luca Dal Negro, and Sebastian A. Schulz
{"title":"基于多分形散射介质的高通量斑点光谱仪","authors":"Bhupesh Kumar, Yilin Zhu, Luca Dal Negro, and Sebastian A. Schulz","doi":"10.1364/ome.511275","DOIUrl":null,"url":null,"abstract":"We present compact integrated speckle spectrometers based on monofractal and multifractal scattering media in a silicon-on-insulator platform. Through both numerical and experimental studies we demonstrate enhanced optical throughput, and hence signal-to-noise ratio, for a number of random structures with tailored multifractal geometries without affecting the spectral decay of the speckle correlation functions. Moreover, we show that the developed multifractal media outperform traditional scattering spectrometers based on uniform random distributions of scattering centers. Our findings establish the potential of low-density random media with multifractal correlations for integrated on-chip applications beyond what is possible with uncorrelated random disorder.","PeriodicalId":19548,"journal":{"name":"Optical Materials Express","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-throughput speckle spectrometers based on multifractal scattering media\",\"authors\":\"Bhupesh Kumar, Yilin Zhu, Luca Dal Negro, and Sebastian A. Schulz\",\"doi\":\"10.1364/ome.511275\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present compact integrated speckle spectrometers based on monofractal and multifractal scattering media in a silicon-on-insulator platform. Through both numerical and experimental studies we demonstrate enhanced optical throughput, and hence signal-to-noise ratio, for a number of random structures with tailored multifractal geometries without affecting the spectral decay of the speckle correlation functions. Moreover, we show that the developed multifractal media outperform traditional scattering spectrometers based on uniform random distributions of scattering centers. Our findings establish the potential of low-density random media with multifractal correlations for integrated on-chip applications beyond what is possible with uncorrelated random disorder.\",\"PeriodicalId\":19548,\"journal\":{\"name\":\"Optical Materials Express\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-03-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Materials Express\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1364/ome.511275\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Materials Express","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1364/ome.511275","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

我们在硅-绝缘体平台上展示了基于单分形和多分形散射介质的紧凑型集成斑点光谱仪。通过数值和实验研究,我们证明了在不影响斑点相关函数光谱衰减的情况下,采用定制多分形几何结构的随机结构可提高光学吞吐量和信噪比。此外,我们还发现所开发的多分形介质优于基于均匀随机散射中心分布的传统散射光谱仪。我们的研究结果确立了具有多分形相关性的低密度随机介质在片上集成应用的潜力,超越了无相关随机无序介质的应用范围。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-throughput speckle spectrometers based on multifractal scattering media
We present compact integrated speckle spectrometers based on monofractal and multifractal scattering media in a silicon-on-insulator platform. Through both numerical and experimental studies we demonstrate enhanced optical throughput, and hence signal-to-noise ratio, for a number of random structures with tailored multifractal geometries without affecting the spectral decay of the speckle correlation functions. Moreover, we show that the developed multifractal media outperform traditional scattering spectrometers based on uniform random distributions of scattering centers. Our findings establish the potential of low-density random media with multifractal correlations for integrated on-chip applications beyond what is possible with uncorrelated random disorder.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Optical Materials Express
Optical Materials Express MATERIALS SCIENCE, MULTIDISCIPLINARY-OPTICS
CiteScore
5.50
自引率
3.60%
发文量
377
审稿时长
1.5 months
期刊介绍: The Optical Society (OSA) publishes high-quality, peer-reviewed articles in its portfolio of journals, which serve the full breadth of the optics and photonics community. Optical Materials Express (OMEx), OSA''s open-access, rapid-review journal, primarily emphasizes advances in both conventional and novel optical materials, their properties, theory and modeling, synthesis and fabrication approaches for optics and photonics; how such materials contribute to novel optical behavior; and how they enable new or improved optical devices. The journal covers a full range of topics, including, but not limited to: Artificially engineered optical structures Biomaterials Optical detector materials Optical storage media Materials for integrated optics Nonlinear optical materials Laser materials Metamaterials Nanomaterials Organics and polymers Soft materials IR materials Materials for fiber optics Hybrid technologies Materials for quantum photonics Optical Materials Express considers original research articles, feature issue contributions, invited reviews, and comments on published articles. The Journal also publishes occasional short, timely opinion articles from experts and thought-leaders in the field on current or emerging topic areas that are generating significant interest.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信