Malik Enniafa, Valerie Kaftandjian, A. Obaton, Sébastien Brzuchacz
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引用次数: 0
摘要
X 射线计算机断层扫描可以扫描部件的内部衰减系数。在 X 射线领域,该系数在很大程度上取决于材料。要从体积数据中进行尺寸测量,需要一个表面(即点云),在这个表面上可以拟合出一个形状,还可以评估体积或表面的测量值,甚至是凹凸度。为了从体积中提取点云,有不同的可配置算法,使用不同的标准。这可能会对提取的表面产生影响,从而影响尺寸测量及其不确定性。对 XCT 测量链的影响参数进行了参数研究,使用 CIVA RT/CT 软件对断层扫描采集建模,并使用 Python 程序提取表面。这有助于更好地了解影响参数对尺寸不确定性的敏感性,并为表面测定提出一些建议。
Configuration of the surface determination parameters for dimensional measurements with/using helpful metric as visualisation tool
X-ray computed tomography allows scanning the internal attenuation coefficient of a part. In X-ray domain, this coefficient
highly depends on the materials. To perform a dimensional measurement from the volumetric data, a surface (i.e. point cloud) is
required, on which a shape can be fitted, and measurements of volumes or surfaces, and even rugosity can be evaluated. To extract
this point cloud from the volume, different configurable algorithms exist, using different criteria. This can have an impact on the
extracted surface and thus on the dimensional measurement and its uncertainty. A parametric study of the influencing parameters
of the XCT measuring chain has been performed, using CIVA RT/CT software to model the tomographic acquisition and Python
programs to extract the surface. This allows to have a better understanding of the sensitivity of the influencing parameters in the
dimensional uncertainty, and to make some recommendations for the surface determination