P. Paramonov, J. Sanctorum, Domenico Iuso, Jan Sijbers, J. De Beenhouwer
{"title":"使用 ASTRA 工具箱的高分辨率平铺 X 射线锥束 CT","authors":"P. Paramonov, J. Sanctorum, Domenico Iuso, Jan Sijbers, J. De Beenhouwer","doi":"10.58286/29258","DOIUrl":null,"url":null,"abstract":"<jats:p>\n\n</jats:p>","PeriodicalId":482749,"journal":{"name":"e-Journal of Nondestructive Testing","volume":"18 4","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-resolution tiled X-ray cone-beam CT using the ASTRA toolbox\",\"authors\":\"P. Paramonov, J. Sanctorum, Domenico Iuso, Jan Sijbers, J. De Beenhouwer\",\"doi\":\"10.58286/29258\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<jats:p>\\n\\n</jats:p>\",\"PeriodicalId\":482749,\"journal\":{\"name\":\"e-Journal of Nondestructive Testing\",\"volume\":\"18 4\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"e-Journal of Nondestructive Testing\",\"FirstCategoryId\":\"0\",\"ListUrlMain\":\"https://doi.org/10.58286/29258\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"e-Journal of Nondestructive Testing","FirstCategoryId":"0","ListUrlMain":"https://doi.org/10.58286/29258","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
