红外热像仪光敏元件形状和尺寸的评估方法

IF 0.4 4区 计算机科学 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
V. V. Abilov, V. A. Streltsov, V. V. Savtsov, S. A. Smotrakov
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引用次数: 0

摘要

摘要 研究了测量扫描式红外热像仪的 NEP 的特点,以便将小物体的图像投射到光敏元件阵列的平面上。结果表明,如果不考虑光敏元件(PSE)的形状和尺寸,现有的红外热像仪 NEP 测量方法会得出错误的结果。本文介绍了一种基于 Richardson-Lucy 迭代解卷积方法的新技术,用于评估 PSE 的形状和尺寸。介绍了在实际光电探测器模块(PM)上应用该技术的结果。不同 PM 子阵列的 PSE 大小存在显著差异。还提出了利用水平狭缝的图像来校正电压灵敏度不均匀性的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Method for Evaluation of the Shape and Dimensions of a Photosensitive Element of an IR FPA

Method for Evaluation of the Shape and Dimensions of a Photosensitive Element of an IR FPA

Abstract

Features of the measurement of the NEP of scanning IR FPAs for projecting of the image of a small object into the plane of the array of photosensitive elements are considered. It is shown that the existing method for the measurement of the NEP of IR FPAs yields an incorrect result when the shape and dimensions of the photosensitive element (PSE) are not taken into account. A new technique for evaluation of the shape and dimensions of the PSE based on the application of the Richardson–Lucy iterative deconvolution method is described. Results of application of the proposed technique on real photodetector modules (PMs) are presented. Significant differences in the sizes of PSEs of different PM subarrays are revealed. The use of the image of a horizontal slit to correct the nonuniformity of the voltage sensitivity is proposed.

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来源期刊
CiteScore
1.00
自引率
20.00%
发文量
170
审稿时长
10.5 months
期刊介绍: Journal of Communications Technology and Electronics is a journal that publishes articles on a broad spectrum of theoretical, fundamental, and applied issues of radio engineering, communication, and electron physics. It publishes original articles from the leading scientific and research centers. The journal covers all essential branches of electromagnetics, wave propagation theory, signal processing, transmission lines, telecommunications, physics of semiconductors, and physical processes in electron devices, as well as applications in biology, medicine, microelectronics, nanoelectronics, electron and ion emission, etc.
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