{"title":"从功能测试序列中提取宽边测试的二维搜索空间","authors":"Irith Pomeranz","doi":"10.1145/3650207","DOIUrl":null,"url":null,"abstract":"<p>Testing for delay faults after chip manufacturing is critical to correct chip operation. Tests for delay faults are applied using scan chains that provide access to internal memory elements. As a result, a circuit may operate under non-functional operation conditions during test application. This may lead to overtesting. The extraction of broadside tests from functional test sequences ensures that the tests create functional operation conditions. When <i>N</i> functional test sequences of length <i>L</i> + 1 are available, the number of broadside tests that can be extracted is <i>N</i> · <i>L</i>. Depending on the source of the functional test sequences, the value of <i>N</i> · <i>L</i> may be large. In this case, it is important to select a subset of <i>n</i> ≤ <i>N</i> sequences, and consider only the first <i>l</i> ≤ <i>L</i> clock cycles of every sequence for the extraction of <i>n</i> · <i>l</i> ≪ <i>N</i> · <i>L</i> broadside tests. The two-dimensional <i>N</i> × <i>L</i> search space for broadside tests is the subject of this article. Using a static procedure that considers fixed values of <i>n</i> and <i>l</i>, the article demonstrates that, for the same value of <i>n</i> · <i>l</i>, different circuits benefit from different values of <i>n</i> and <i>l</i>. It also describes a dynamic procedure that matches the parameters <i>n</i> and <i>l</i> to the circuit. The discussion is supported by experimental results for transition faults in benchmark circuits.</p>","PeriodicalId":50944,"journal":{"name":"ACM Transactions on Design Automation of Electronic Systems","volume":null,"pages":null},"PeriodicalIF":2.2000,"publicationDate":"2024-03-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"2D Search Space for Extracting Broadside Tests from Functional Test Sequences\",\"authors\":\"Irith Pomeranz\",\"doi\":\"10.1145/3650207\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Testing for delay faults after chip manufacturing is critical to correct chip operation. Tests for delay faults are applied using scan chains that provide access to internal memory elements. As a result, a circuit may operate under non-functional operation conditions during test application. This may lead to overtesting. The extraction of broadside tests from functional test sequences ensures that the tests create functional operation conditions. When <i>N</i> functional test sequences of length <i>L</i> + 1 are available, the number of broadside tests that can be extracted is <i>N</i> · <i>L</i>. Depending on the source of the functional test sequences, the value of <i>N</i> · <i>L</i> may be large. In this case, it is important to select a subset of <i>n</i> ≤ <i>N</i> sequences, and consider only the first <i>l</i> ≤ <i>L</i> clock cycles of every sequence for the extraction of <i>n</i> · <i>l</i> ≪ <i>N</i> · <i>L</i> broadside tests. The two-dimensional <i>N</i> × <i>L</i> search space for broadside tests is the subject of this article. Using a static procedure that considers fixed values of <i>n</i> and <i>l</i>, the article demonstrates that, for the same value of <i>n</i> · <i>l</i>, different circuits benefit from different values of <i>n</i> and <i>l</i>. It also describes a dynamic procedure that matches the parameters <i>n</i> and <i>l</i> to the circuit. The discussion is supported by experimental results for transition faults in benchmark circuits.</p>\",\"PeriodicalId\":50944,\"journal\":{\"name\":\"ACM Transactions on Design Automation of Electronic Systems\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2024-03-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACM Transactions on Design Automation of Electronic Systems\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1145/3650207\",\"RegionNum\":4,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM Transactions on Design Automation of Electronic Systems","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1145/3650207","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
摘要
芯片制造后的延迟故障测试对芯片的正确运行至关重要。延迟故障测试是通过扫描链进行的,扫描链可访问内部存储器元件。因此,在测试过程中,电路可能会在非功能操作条件下运行。这可能会导致过度测试。从功能测试序列中提取宽边测试可确保测试创建功能操作条件。根据功能测试序列的来源,N - L 的值可能很大。在这种情况下,重要的是选择 n ≤ N 个序列的子集,并只考虑每个序列的前 l ≤ L 个时钟周期,以提取 n - l ≪ N - L 个宽边测试。宽边测试的二维 N × L 搜索空间是本文的主题。文章使用一种考虑固定 n 和 l 值的静态程序,证明了对于相同的 n - l 值,不同的电路从不同的 n 和 l 值中获益。讨论得到了基准电路中过渡故障的实验结果的支持。
2D Search Space for Extracting Broadside Tests from Functional Test Sequences
Testing for delay faults after chip manufacturing is critical to correct chip operation. Tests for delay faults are applied using scan chains that provide access to internal memory elements. As a result, a circuit may operate under non-functional operation conditions during test application. This may lead to overtesting. The extraction of broadside tests from functional test sequences ensures that the tests create functional operation conditions. When N functional test sequences of length L + 1 are available, the number of broadside tests that can be extracted is N · L. Depending on the source of the functional test sequences, the value of N · L may be large. In this case, it is important to select a subset of n ≤ N sequences, and consider only the first l ≤ L clock cycles of every sequence for the extraction of n · l ≪ N · L broadside tests. The two-dimensional N × L search space for broadside tests is the subject of this article. Using a static procedure that considers fixed values of n and l, the article demonstrates that, for the same value of n · l, different circuits benefit from different values of n and l. It also describes a dynamic procedure that matches the parameters n and l to the circuit. The discussion is supported by experimental results for transition faults in benchmark circuits.
期刊介绍:
TODAES is a premier ACM journal in design and automation of electronic systems. It publishes innovative work documenting significant research and development advances on the specification, design, analysis, simulation, testing, and evaluation of electronic systems, emphasizing a computer science/engineering orientation. Both theoretical analysis and practical solutions are welcome.