{"title":"利用 k 最短路径算法评估智能微电网可靠性的新方法","authors":"Mohammadreza Gholami, Meysam Mohammadtaheri, Alireza Gholami","doi":"10.1177/1748006x231214337","DOIUrl":null,"url":null,"abstract":"The reliability of cyber-physical microgrids (MGs) is crucial in the development of smart grids. The reliability of MGs can be affected by cyber network failures, which have a significant impact on the physical components. Since MGs have interdependent cyber and physical elements, a smart MG can be viewed as a system of n dependent two-mode components. This paper proposes an approach to finding the k most likely configurations of the system. The method involves three phases. Firstly, the multi-mode model is obtained for physical components, considering the operation and topology of the cyber network. Then, the problem is transformed to finding the k most likely state of a system consisting of n independent multi-mode components. In the second phase, a transformation using new transformed metrics is applied. This results in the problem being converted to finding the k shortest path, which can be solved using efficient algorithms. Finally, the states are evaluated using a DC load flow, and reliability indices such as loss of load probability (LOLP) and expected energy not supplied (EENS) are calculated. Moreover, we have incorporated the dynamic thermal rating (DTR) system into our proposed model, addressing the safe enhancement of system component ratings. The results indicate that the most probable states of the system are related to the failure of distribution generators. The most severe events occur due to failure in the cyber network, and cyber network malfunction has a higher effect on EENS compared to LOLP. Additionally, we observe a significant enhancement in reliability indices when considering the DTR system over the static thermal rating (STR) system.This approach is efficient in reliability calculation using fewer system states.","PeriodicalId":51266,"journal":{"name":"Proceedings of the Institution of Mechanical Engineers Part O-Journal of Risk and Reliability","volume":null,"pages":null},"PeriodicalIF":1.7000,"publicationDate":"2024-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new approach for reliability assessment of the smart microgrids using k-shortest path algorithms\",\"authors\":\"Mohammadreza Gholami, Meysam Mohammadtaheri, Alireza Gholami\",\"doi\":\"10.1177/1748006x231214337\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reliability of cyber-physical microgrids (MGs) is crucial in the development of smart grids. 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引用次数: 0
摘要
网络物理微电网(MGs)的可靠性对智能电网的发展至关重要。微电网的可靠性会受到网络故障的影响,而网络故障会对物理元件产生重大影响。由于 MG 具有相互依赖的网络和物理元件,因此可以将智能 MG 视为由 n 个相互依赖的双模元件组成的系统。本文提出了一种寻找系统 k 种最可能配置的方法。该方法包括三个阶段。首先,考虑到网络的运行和拓扑结构,获得物理元件的多模式模型。然后,将问题转换为寻找由 n 个独立多模式组件组成的系统的 k 个最可能状态。在第二阶段,使用新的转换指标进行转换。其结果是将问题转换为寻找 k 条最短路径,这可以通过高效算法来解决。最后,使用直流负载流对状态进行评估,并计算出可靠性指数,如负载损失概率 (LOLP) 和预期未供应能量 (EENS)。此外,我们还将动态热额定值(DTR)系统纳入了我们提出的模型,以解决系统组件额定值的安全提升问题。结果表明,系统最可能出现的状态与配电发电机故障有关。最严重的事件发生在网络故障上,与 LOLP 相比,网络故障对 EENS 的影响更大。此外,与静态热额定值(STR)系统相比,我们观察到 DTR 系统的可靠性指数显著提高。
A new approach for reliability assessment of the smart microgrids using k-shortest path algorithms
The reliability of cyber-physical microgrids (MGs) is crucial in the development of smart grids. The reliability of MGs can be affected by cyber network failures, which have a significant impact on the physical components. Since MGs have interdependent cyber and physical elements, a smart MG can be viewed as a system of n dependent two-mode components. This paper proposes an approach to finding the k most likely configurations of the system. The method involves three phases. Firstly, the multi-mode model is obtained for physical components, considering the operation and topology of the cyber network. Then, the problem is transformed to finding the k most likely state of a system consisting of n independent multi-mode components. In the second phase, a transformation using new transformed metrics is applied. This results in the problem being converted to finding the k shortest path, which can be solved using efficient algorithms. Finally, the states are evaluated using a DC load flow, and reliability indices such as loss of load probability (LOLP) and expected energy not supplied (EENS) are calculated. Moreover, we have incorporated the dynamic thermal rating (DTR) system into our proposed model, addressing the safe enhancement of system component ratings. The results indicate that the most probable states of the system are related to the failure of distribution generators. The most severe events occur due to failure in the cyber network, and cyber network malfunction has a higher effect on EENS compared to LOLP. Additionally, we observe a significant enhancement in reliability indices when considering the DTR system over the static thermal rating (STR) system.This approach is efficient in reliability calculation using fewer system states.
期刊介绍:
The Journal of Risk and Reliability is for researchers and practitioners who are involved in the field of risk analysis and reliability engineering. The remit of the Journal covers concepts, theories, principles, approaches, methods and models for the proper understanding, assessment, characterisation and management of the risk and reliability of engineering systems. The journal welcomes papers which are based on mathematical and probabilistic analysis, simulation and/or optimisation, as well as works highlighting conceptual and managerial issues. Papers that provide perspectives on current practices and methods, and how to improve these, are also welcome