使用 CMOS 传感器阵列的微米级三维电容断层扫描。

Manar Abdelatty, Joseph Incandela, Kangping Hu, Joseph W Larkin, Sherief Reda, Jacob K Rosenstein
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引用次数: 0

摘要

电容层析成像(ECT)是一种非光学成像技术,通过在边界进行电容测量并求解逆问题,可以估算出一个体积的内部介电常数图。虽然以前的 ECT 演示通常是在厘米尺度上进行的,但 ECT 并不局限于宏观系统。在本文中,我们利用 CMOS 微电极阵列演示了聚合物微球和细菌生物膜的 ECT 成像,实现了 10 微米的空间分辨率。此外,我们还提出了一种深度学习架构和改进的多目标训练方案,用于根据传感器测量结果重建面外介电常数图。实验结果表明,所提出的方法能够解析微观三维结构,在微球数据集上实现了 91.5% 的预测准确率,在生物膜数据集上实现了 82.7% 的预测准确率,与基线计算方法相比平均提高了 4.6%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Microscale 3-D Capacitance Tomography with a CMOS Sensor Array.

Electrical capacitance tomography (ECT) is a non-optical imaging technique in which a map of the interior permittivity of a volume is estimated by making capacitance measurements at its boundary and solving an inverse problem. While previous ECT demonstrations have often been at centimeter scales, ECT is not limited to macroscopic systems. In this paper, we demonstrate ECT imaging of polymer microspheres and bacterial biofilms using a CMOS microelectrode array, achieving spatial resolution of 10 microns. Additionally, we propose a deep learning architecture and an improved multi-objective training scheme for reconstructing out-of-plane permittivity maps from the sensor measurements. Experimental results show that the proposed approach is able to resolve microscopic 3-D structures, achieving 91.5% prediction accuracy on the microsphere dataset and 82.7% on the biofilm dataset, including an average of 4.6% improvement over baseline computational methods.

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