基于 GRU-LSTM 神经网络的半导体器件可靠性预测

{"title":"基于 GRU-LSTM 神经网络的半导体器件可靠性预测","authors":"Shufeng Tang, Xuesong Xie, Xiaoling Zhang","doi":"10.1117/12.3025192","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":517067,"journal":{"name":"International Conference on Optoelectronic Materials and Devices (ICOMD 2023)","volume":"78 4","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-02-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reliability prediction of semiconductor devices based on GRU-LSTM neural network\",\"authors\":\"Shufeng Tang, Xuesong Xie, Xiaoling Zhang\",\"doi\":\"10.1117/12.3025192\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":517067,\"journal\":{\"name\":\"International Conference on Optoelectronic Materials and Devices (ICOMD 2023)\",\"volume\":\"78 4\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-02-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Optoelectronic Materials and Devices (ICOMD 2023)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.3025192\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Optoelectronic Materials and Devices (ICOMD 2023)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.3025192","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}