低频噪声表征正偏压对 β-Ga2O3 FinFET 中陷阱空间分布的影响

H. Bae, Geon Bum Lee, Jaewook Yoo, Khwang-Sun Lee, Ja-Yun Ku, Kihyun Kim, Jungsik Kim, Peide D. Ye, Jun-Young Park, Yang-Kyu Choi
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Low-Frequency Noise Characterization of Positive Bias Stress Effect on the Spatial Distribution of Trap in β-Ga2O3 FinFET
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