Combining Wave and Particle Effects in the Simulation of X-ray Phase Contrast—A Review

X-ray phase-contrast imaging (XPCI) is a family of imaging techniques that makes contrast visible due to phase shifts in the sample. Phase-sensitive techniques can potentially be several orders of magnitude more sensitive than attenuation-based techniques, finding applications in a wide range of fields, from biomedicine to materials science. The accurate simulation of XPCI allows for the planning of imaging experiments, potentially reducing the need for costly synchrotron beam access to find suitable imaging parameters. It can also provide training data for recently proposed machine learning-based phase retrieval algorithms. The simulation of XPCI has classically been carried out using wave optics or ray optics approaches. However, these approaches have not been capable of simulating all the artifacts present in experimental images. The increased interest in dark-field imaging has also prompted the inclusion of scattering in XPCI simulation codes. Scattering is classically simulated using Monte Carlo particle transport codes. The combination of the two perspectives has proven not to be straightforward, and several methods have been proposed. We review the available literature on the simulation of XPCI with attention given to particular methods, including the scattering component, and discuss the possible future directions for the simulation of both wave and particle effects in XPCI.