Marin Tharrault, Eva Desgué, Dominique Carisetti, Bernard Plaçais, Christophe Voisin, Pierre Legagneux, Emmanuel Baudin
{"title":"单层到块状 PtSe2 剥离晶体的拉曼光谱分析","authors":"Marin Tharrault, Eva Desgué, Dominique Carisetti, Bernard Plaçais, Christophe Voisin, Pierre Legagneux, Emmanuel Baudin","doi":"10.1088/2053-1583/ad1e79","DOIUrl":null,"url":null,"abstract":"Raman spectroscopy is widely used to assess the quality of 2D materials thin films. This report focuses on <inline-formula>\n<tex-math><?CDATA $\\mathrm{PtSe_2}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:mrow><mml:mi mathvariant=\"normal\">P</mml:mi><mml:mi mathvariant=\"normal\">t</mml:mi><mml:mi mathvariant=\"normal\">S</mml:mi><mml:msub><mml:mi mathvariant=\"normal\">e</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>\n<inline-graphic xlink:href=\"tdmad1e79ieqn1.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula>, a noble transition metal dichalcogenide which has the remarkable property to transit from a semi-conductor to a semi-metal with increasing layer number. While polycrystalline <inline-formula>\n<tex-math><?CDATA $\\mathrm{PtSe_2}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:mrow><mml:mi mathvariant=\"normal\">P</mml:mi><mml:mi mathvariant=\"normal\">t</mml:mi><mml:mi mathvariant=\"normal\">S</mml:mi><mml:msub><mml:mi mathvariant=\"normal\">e</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>\n<inline-graphic xlink:href=\"tdmad1e79ieqn2.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula> can be grown with various crystalline qualities, getting insight into the monocrystalline intrinsic properties remains challenging. We report on the study of exfoliated 1–10 layers <inline-formula>\n<tex-math><?CDATA $\\mathrm{PtSe_2}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:mrow><mml:mi mathvariant=\"normal\">P</mml:mi><mml:mi mathvariant=\"normal\">t</mml:mi><mml:mi mathvariant=\"normal\">S</mml:mi><mml:msub><mml:mi mathvariant=\"normal\">e</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>\n<inline-graphic xlink:href=\"tdmad1e79ieqn3.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula> by Raman spectroscopy, featuring record linewidth. The clear Raman signatures allow layer-thickness identification and provides a reference metrics to assess crystal quality of grown films.","PeriodicalId":6812,"journal":{"name":"2D Materials","volume":"79 1","pages":""},"PeriodicalIF":4.5000,"publicationDate":"2024-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Raman spectroscopy of monolayer to bulk PtSe2 exfoliated crystals\",\"authors\":\"Marin Tharrault, Eva Desgué, Dominique Carisetti, Bernard Plaçais, Christophe Voisin, Pierre Legagneux, Emmanuel Baudin\",\"doi\":\"10.1088/2053-1583/ad1e79\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Raman spectroscopy is widely used to assess the quality of 2D materials thin films. This report focuses on <inline-formula>\\n<tex-math><?CDATA $\\\\mathrm{PtSe_2}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:mrow><mml:mi mathvariant=\\\"normal\\\">P</mml:mi><mml:mi mathvariant=\\\"normal\\\">t</mml:mi><mml:mi mathvariant=\\\"normal\\\">S</mml:mi><mml:msub><mml:mi mathvariant=\\\"normal\\\">e</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>\\n<inline-graphic xlink:href=\\\"tdmad1e79ieqn1.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula>, a noble transition metal dichalcogenide which has the remarkable property to transit from a semi-conductor to a semi-metal with increasing layer number. While polycrystalline <inline-formula>\\n<tex-math><?CDATA $\\\\mathrm{PtSe_2}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:mrow><mml:mi mathvariant=\\\"normal\\\">P</mml:mi><mml:mi mathvariant=\\\"normal\\\">t</mml:mi><mml:mi mathvariant=\\\"normal\\\">S</mml:mi><mml:msub><mml:mi mathvariant=\\\"normal\\\">e</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>\\n<inline-graphic xlink:href=\\\"tdmad1e79ieqn2.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula> can be grown with various crystalline qualities, getting insight into the monocrystalline intrinsic properties remains challenging. We report on the study of exfoliated 1–10 layers <inline-formula>\\n<tex-math><?CDATA $\\\\mathrm{PtSe_2}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:mrow><mml:mi mathvariant=\\\"normal\\\">P</mml:mi><mml:mi mathvariant=\\\"normal\\\">t</mml:mi><mml:mi mathvariant=\\\"normal\\\">S</mml:mi><mml:msub><mml:mi mathvariant=\\\"normal\\\">e</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>\\n<inline-graphic xlink:href=\\\"tdmad1e79ieqn3.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula> by Raman spectroscopy, featuring record linewidth. The clear Raman signatures allow layer-thickness identification and provides a reference metrics to assess crystal quality of grown films.\",\"PeriodicalId\":6812,\"journal\":{\"name\":\"2D Materials\",\"volume\":\"79 1\",\"pages\":\"\"},\"PeriodicalIF\":4.5000,\"publicationDate\":\"2024-01-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2D Materials\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1088/2053-1583/ad1e79\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2D Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1088/2053-1583/ad1e79","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Raman spectroscopy of monolayer to bulk PtSe2 exfoliated crystals
Raman spectroscopy is widely used to assess the quality of 2D materials thin films. This report focuses on PtSe2, a noble transition metal dichalcogenide which has the remarkable property to transit from a semi-conductor to a semi-metal with increasing layer number. While polycrystalline PtSe2 can be grown with various crystalline qualities, getting insight into the monocrystalline intrinsic properties remains challenging. We report on the study of exfoliated 1–10 layers PtSe2 by Raman spectroscopy, featuring record linewidth. The clear Raman signatures allow layer-thickness identification and provides a reference metrics to assess crystal quality of grown films.
期刊介绍：
2D Materials is a multidisciplinary, electronic-only journal devoted to publishing fundamental and applied research of the highest quality and impact covering all aspects of graphene and related two-dimensional materials.
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