用半参数累积概率模型解决多重检测极限问题

IF 4.3 3区材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

ACS Applied Electronic Materials Pub Date : 2024-02-13 DOI:10.1080/01621459.2024.2315667

Yuqi Tian, Chun Li, Shengxin Tu, Nathan T. James, Frank E. Harrell, Bryan E. Shepherd

{"title":"用半参数累积概率模型解决多重检测极限问题","authors":"Yuqi Tian, Chun Li, Shengxin Tu, Nathan T. James, Frank E. Harrell, Bryan E. Shepherd","doi":"10.1080/01621459.2024.2315667","DOIUrl":null,"url":null,"abstract":"Detection limits (DLs), where a variable cannot be measured outside of a certain range, are common in research. DLs may vary across study sites or over time. Most approaches to handling DLs in resp...","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2024-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Addressing Multiple Detection Limits with Semiparametric Cumulative Probability Models\",\"authors\":\"Yuqi Tian, Chun Li, Shengxin Tu, Nathan T. James, Frank E. Harrell, Bryan E. Shepherd\",\"doi\":\"10.1080/01621459.2024.2315667\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Detection limits (DLs), where a variable cannot be measured outside of a certain range, are common in research. DLs may vary across study sites or over time. Most approaches to handling DLs in resp...\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2024-02-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"100\",\"ListUrlMain\":\"https://doi.org/10.1080/01621459.2024.2315667\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1080/01621459.2024.2315667","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}

引用次数: 0

摘要

检测限（DL）是指在一定范围外无法测量变量，这在研究中很常见。不同研究地点或不同时间的检测限可能会有所不同。大多数处理 DLs 的方法都是...

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Addressing Multiple Detection Limits with Semiparametric Cumulative Probability Models

Detection limits (DLs), where a variable cannot be measured outside of a certain range, are common in research. DLs may vary across study sites or over time. Most approaches to handling DLs in resp...

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来源期刊

ACS Applied Electronic Materials Multiple-

CiteScore

7.20

自引率

4.30%

发文量

567