用于片状均质目标微波成像的深度学习增强型反向散射框架

Álvaro Yago Ruiz, Marija Nikolic Stevanovic, Marta Cavagnaro, Lorenzo Crocco
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引用次数: 0

摘要

在本文中,我们提出了一种解决反向散射问题的框架,它将传统成像方法与深度学习相结合。我们的目标是对片状均质目标进行成像,并分三步走。首先,通过正交采样法处理原始数据,获得目标的定性图像。然后,将该图像输入 U-Net 网络。为了利用待检索信息的隐含稀疏性,对网络进行训练,以检索未知对比度的空间梯度图。最后,通过简单的后处理,将这种增强形状转化为未知介电常数图。由于所有处理步骤都是实时执行的,因此该框架的计算效率很高。为了举例说明可实现的性能,我们使用了菲涅尔实验数据作为验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A deep learning enhanced inverse scattering framework for microwave imaging of piece-wise homogeneous targets
In this paper, we present a framework for the solution of inverse scattering problems that integrates traditional imaging methods and deep learning. The goal is to image piece-wise homogeneous targets and it is pursued in three steps. First, rawdata are processed via Orthogonality Sampling Method to obtain a qualitative image of the targets. Then, such an image is fed into a U-Net. In order to take advantage of the implicitly sparse nature of the information to be retrieved, the network is trained to retrieve a map of the spatial gradient of the unknown contrast. Finally, such an augmented shape is turned into a map of the unknown permittivity by means of a simple post-processing. The framework is computationally effective, since all processing steps are performed in real-time. To provide an example of the achievable performance, Fresnel experimental data have been used as a validation.
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