利用光学等离子体诊断方法研究高压氦等离子体中的小分子杂质

K. Urabe, Minami Toyoda, Yoshinori Matsuoka, Koji Eriguchi
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引用次数: 0

摘要

在使用稀有气体稀释的高压等离子体中,放电空间中的小部分杂质会对基本等离子体参数和激发态生成过程产生重大影响。本研究利用光学等离子体诊断方法研究了在高纯度 He 气体流中产生的介质势垒放电(DBD)中分子杂质的行为。在不同放电条件(压力、流速和电压频率)下获得的光学发射光谱表明,He DBD 中的主要杂质为 H2O 分子,DBD 在到达测量点之前就分解了 H2O。为了定量分析 H2O 部分,采用了时间分辨激光吸收光谱(LAS)来测量 He-DBD 中 He 可转移(Hem)原子的寿命。根据 Hem 的寿命与电压频率的关系,得出了 He 气体流中的 H2O 分量。此外,还提出了一个模型,用于根据少量参考数据估算不同 He 压力和流速条件下的 H2O 分数。进行光学等离子体诊断和评估 H2O 杂质的比例和行为的程序有望促进更好地理解和控制高压等离子体。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of small-fraction molecular impurities in high-pressure helium plasmas using optical plasma diagnostic methods
In high-pressure plasmas using gases diluted via a rare gas, small-fraction impurities in the discharge space significantly impact the basic plasma parameters and excited-species generation processes. This study investigated the behaviors of molecular impurities in a dielectric barrier discharge (DBD) generated in a flow of high-purity He gas using optical plasma diagnostics methods. The optical emission spectra obtained under various discharge conditions (pressure, flow rate, and voltage frequency) indicated the major impurity species in the He DBD as the H2O molecule, and the DBD decomposed the H2O before reaching the measurement spot. To quantitatively analyze the H2O fraction, time-resolved laser absorption spectroscopy (LAS) was performed to measure the lifetime of He metastable (Hem) atoms in the He-DBD. The H2O fraction in the He gas flow was derived from the dependence of Hem lifetime on the voltage frequency. In addition, a model was proposed to estimate the H2O fraction under various He pressure and flow rate conditions from few reference data. The procedures to perform the optical plasma diagnostics and evaluate the fraction and behaviors of H2O impurity are expected to facilitate a better understanding and control of high-pressure plasmas.
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