利用深度神经网络检测主板中由客户引起的损坏的主动学习方法

Lucas Cabral, Victor Farias, Lucas Sena, Iago Chaves, J. P. Gomes, João Pedro Santiago, Diego Sá, Javam Machado, João Paulo Madeiro
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摘要

识别客户引起的损坏(CID)是电子产品制造商保修计划的关键部分。CID 是指未经授权的人员(包括客户)在印刷电路板 (PCB) 上对设备造成的任何损坏。在这种情况下,损坏的设备不在保修范围内。CID 的检测通常由人工完成,成本高且容易出错。使用深度神经网络进行物体检测的现代计算机视觉技术可以自动、准确地检测 PCB 上的 CID。此类网络的训练需要大量标有 CID 的图像示例数据集。硬件工厂和维修中心每天都会生成数百张未标记的图像。手动标记这些图像既费力又费时。因此,关键是要标注最少的图像,这样训练出来的神经网络才能达到与用整个数据集训练出来的神经网络相当的准确性。为此,我们提出了一种主动学习方法,为物体检测器选择信息量最大的图像。为此,我们的方法基于物体检测器的不确定性,即根据物体检测器给出的类别概率分布来选择新图像。此外,我们还解决了这一问题所固有的一些挑战:i) 这是一个多类对象检测问题,因为存在多种类型的缺陷;ii) 存在类别准确性不平衡的问题;iii) 需要关注召回率,例如,误报比误报危害小;iv) 有许多图像没有对象,不应该选择这些图像进行标记。我们使用这种方法对数据进行迭代采样、训练和评估模型,并将其与随机采样数据进行比较,从而对其进行评估。结果表明,我们的方法始终优于随机抽样,平均差值达 21.6%,证明它是在这一领域降低标注成本和提高检测准确率的可行替代方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An Active Learning Approach for Detecting Customer Induced Damages in Motherboards with Deep Neural Networks
Identifying Customer Induced Damage (CID) is a key part in warranty programs of electronics manufacturers. CID is defined as any damage in the unit performed by an unauthorized person including the customer in a Printed Circuit Board (PCB). In such cases, damaged units are not covered by warranty. The inspection of CIDs is usually performed by humans which may be costly and error prone. Modern computer vision techniques for object detection using deep neural networks can automatically and accurately detect CIDs on PCBs. The training of such networks requires a large labeled dataset of image examples of CIDs. Daily, hardware factories and repair centers generate hundreds of unlabeled images. Labeling them manually is laborious and time-consuming. Therefore, it is crucial to label the minimum amount of images such that the trained neural network can achieve comparable accuracy as if it were trained with the whole dataset. To this end, we propose an active learning approach that selects the most informative images for the object detector. For that, our approach is based on the uncertainty of the object detector, i.e., it selects new images based on class probability distribution given by the object detector. Also, we tackle some challenges that are intrinsic to this problem: i) it is a multiclass object detection problem since there are many types of defects; ii) there is a class accuracy imbalance; iii) there is a focus on recall, e.g. false positives are less harmful than false negatives, and iv) there are many images with no object which should not be selected for labeling. We evaluate this approach by using it to iteratively sample data, train and evaluate a model, and compare it with randomly sampled data. The results show that our method consistently outperforms random sampling by an average margin of 21.6%, proving to be a viable alternative for reducing the labeling cost and increasing detection accuracy in this domain.
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