利用深度学习推动电子显微镜技术的发展

Kunpeng Chen, A. S. Barnard
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引用次数: 0

摘要

电子显微镜作为显微分析的一个分支领域,是其自身成功的受害者。电子显微镜在分子和材料成像方面的广泛应用,对我们了解无数系统产生了巨大影响,并加速了电子、能源、环境和健康应用领域的药物发现和材料设计。随着这一成就的取得,一个瓶颈出现了,因为我们收集数据的速度大大超过了分析数据的速度。幸运的是,这与包括数据科学和机器学习在内的先进计算方法的兴起不谋而合。深度学习是机器学习的一个分支领域,能够从大量数据(如图像)中学习,非常适合克服电子显微镜大规模应用所面临的一些挑战。与该领域相关的深度学习方法多种多样,各有优缺点。在这篇综述中,我们将介绍一些成熟的方法和最近的一些实例,并介绍计算机科学领域目前出现的一些新方法。我们对深度学习的总结旨在指导电子显微镜专家选择适合其研究的深度学习算法,并为其数字化未来做好准备。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Advancing Electron Microscopy using Deep Learning
Electron microscopy, a sub-field of microanalysis, is a victim of its own success. The widespread use of electron microscopy for imaging molecules and materials has had an enormous impact on our understanding of countless systems and has accelerated impacts in drug discovery and materials design, for electronic, energy, environment and health applications. With this success a bottleneck has emerged, as the rate at which we can collect data has significantly exceeded the rate at which we can analyse it. Fortunately, this has coincided with the rise of advanced computational methods, including data science and machine learning. Deep learning, a sub-field of machine learning capable of learning from large quantities of data such as images, is ideally suited to overcome some of the challenges of electron microscopy at scale. There are a variety of different deep learning approaches relevant to the field, with unique advantages and disadvantages. In this review, we describe some well-established methods, with some recent examples, and introduce some new methods currently emerging in computer science. Our summary of deep learning is designed to guide electron microscopists to choose the right deep learning algorithm for their research and prepare for their digital future.
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