超越地球的界限:提高空间应用集成电路的抗辐射能力

Gianluca Pace
{"title":"超越地球的界限:提高空间应用集成电路的抗辐射能力","authors":"Gianluca Pace","doi":"10.37547/tajiir/volume06issue01-02","DOIUrl":null,"url":null,"abstract":"This research delves into the critical realm of space applications by conducting an experimental analysis and investigation into the effects of radiation on integrated circuits. As space missions become more advanced and extended, the resilience of electronic components, particularly integrated circuits, to radiation becomes paramount. Through rigorous experimentation, this study aimsto enhance our understanding of the impact of radiation on integrated circuits and pave the way for the development of more robust and reliable technologies for space exploration.","PeriodicalId":22348,"journal":{"name":"The American Journal of Interdisciplinary Innovations and Research","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"BEYOND EARTH'S BOUNDS: ADVANCING RADIATION RESILIENCE IN INTEGRATED CIRCUITS FOR SPACE APPLICATIONS\",\"authors\":\"Gianluca Pace\",\"doi\":\"10.37547/tajiir/volume06issue01-02\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This research delves into the critical realm of space applications by conducting an experimental analysis and investigation into the effects of radiation on integrated circuits. As space missions become more advanced and extended, the resilience of electronic components, particularly integrated circuits, to radiation becomes paramount. Through rigorous experimentation, this study aimsto enhance our understanding of the impact of radiation on integrated circuits and pave the way for the development of more robust and reliable technologies for space exploration.\",\"PeriodicalId\":22348,\"journal\":{\"name\":\"The American Journal of Interdisciplinary Innovations and Research\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The American Journal of Interdisciplinary Innovations and Research\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.37547/tajiir/volume06issue01-02\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The American Journal of Interdisciplinary Innovations and Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.37547/tajiir/volume06issue01-02","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

这项研究通过对辐射对集成电路的影响进行实验分析和调查,深入探讨了空间应用的关键领域。随着太空任务越来越先进和扩展,电子元件,尤其是集成电路对辐射的适应能力变得至关重要。通过严格的实验,这项研究旨在加深我们对辐射对集成电路影响的理解,为开发更强大、更可靠的太空探索技术铺平道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
BEYOND EARTH'S BOUNDS: ADVANCING RADIATION RESILIENCE IN INTEGRATED CIRCUITS FOR SPACE APPLICATIONS
This research delves into the critical realm of space applications by conducting an experimental analysis and investigation into the effects of radiation on integrated circuits. As space missions become more advanced and extended, the resilience of electronic components, particularly integrated circuits, to radiation becomes paramount. Through rigorous experimentation, this study aimsto enhance our understanding of the impact of radiation on integrated circuits and pave the way for the development of more robust and reliable technologies for space exploration.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信