{"title":"2023 年计量无国界","authors":"V. I. Matveev","doi":"10.14489/td.2023.08.pp.058-062","DOIUrl":null,"url":null,"abstract":"The content of the International Metrology Forum dedicated to the next World Metrology Day and the accompanying exhibition is briefly described. The main topics of the business program were the improvement of the level of metrological measurements, the development of standardization systems and product certification. The exhibition demonstrated modern metrological measuring instruments and product certification produced by leading enterprises of the industry.","PeriodicalId":432853,"journal":{"name":"Kontrol'. Diagnostika","volume":"6 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"METROLOGY WITHOUT BORDERS 2023\",\"authors\":\"V. I. Matveev\",\"doi\":\"10.14489/td.2023.08.pp.058-062\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The content of the International Metrology Forum dedicated to the next World Metrology Day and the accompanying exhibition is briefly described. The main topics of the business program were the improvement of the level of metrological measurements, the development of standardization systems and product certification. The exhibition demonstrated modern metrological measuring instruments and product certification produced by leading enterprises of the industry.\",\"PeriodicalId\":432853,\"journal\":{\"name\":\"Kontrol'. Diagnostika\",\"volume\":\"6 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Kontrol'. Diagnostika\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.14489/td.2023.08.pp.058-062\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Kontrol'. Diagnostika","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.14489/td.2023.08.pp.058-062","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The content of the International Metrology Forum dedicated to the next World Metrology Day and the accompanying exhibition is briefly described. The main topics of the business program were the improvement of the level of metrological measurements, the development of standardization systems and product certification. The exhibition demonstrated modern metrological measuring instruments and product certification produced by leading enterprises of the industry.
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