{"title":"低相位噪声光延迟线光电振荡器不确定性评估","authors":"Patrice Salzenstein","doi":"10.1117/12.2689283","DOIUrl":null,"url":null,"abstract":"In this paper, we present the operation of an optoelectronic oscillator. We look at the evaluation of the uncertainty associated with the measurement of the phase noise of the signal emitted by this oscillator. Uncertainty on the phase noise measured for a low phase noise compact optical delay line optoelectronic oscillator is evaluated as ±1.5 dB at 2 σ.","PeriodicalId":149506,"journal":{"name":"SPIE/COS Photonics Asia","volume":"26 7","pages":"127640Q - 127640Q-6"},"PeriodicalIF":0.0000,"publicationDate":"2023-11-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Low phase noise optical delay line optoelectronic oscillator uncertainty evaluation\",\"authors\":\"Patrice Salzenstein\",\"doi\":\"10.1117/12.2689283\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present the operation of an optoelectronic oscillator. We look at the evaluation of the uncertainty associated with the measurement of the phase noise of the signal emitted by this oscillator. Uncertainty on the phase noise measured for a low phase noise compact optical delay line optoelectronic oscillator is evaluated as ±1.5 dB at 2 σ.\",\"PeriodicalId\":149506,\"journal\":{\"name\":\"SPIE/COS Photonics Asia\",\"volume\":\"26 7\",\"pages\":\"127640Q - 127640Q-6\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-11-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"SPIE/COS Photonics Asia\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2689283\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE/COS Photonics Asia","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2689283","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low phase noise optical delay line optoelectronic oscillator uncertainty evaluation
In this paper, we present the operation of an optoelectronic oscillator. We look at the evaluation of the uncertainty associated with the measurement of the phase noise of the signal emitted by this oscillator. Uncertainty on the phase noise measured for a low phase noise compact optical delay line optoelectronic oscillator is evaluated as ±1.5 dB at 2 σ.