{"title":"传导冷却端泵浦板条激光放大器热焦距模拟","authors":"Wentao Wang, S. Bian, Lei Liu, Chao Wang, Lu Chen","doi":"10.1117/12.3009375","DOIUrl":null,"url":null,"abstract":"This paper introduces the simulation of the thermal focal length brought by the Conduction Cooling End-Pumped Slat(CCEPS) laser amplification module under the action of thermal stress. Through simulation analysis, it is found that the thermal focal length of CCEPS lath crystal is affected by two factors, temperature distribution and stress distribution. One of these two factors brings a positive lens effect, the other may bring a negative lens effect, and it may also bring a positive lens effect at the same time. In order to find out the law of thermal lens effect in CCEPS module, a comprehensive simulation analysis of CCEPS module is carried out. This paper provides a strong theoretical support for further experimental verification.","PeriodicalId":502341,"journal":{"name":"Applied Optics and Photonics China","volume":"87 ","pages":"129591E - 129591E-3"},"PeriodicalIF":0.0000,"publicationDate":"2023-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Simulation of thermal focal length of conduction cooling end-pumped slat laser amplifier\",\"authors\":\"Wentao Wang, S. Bian, Lei Liu, Chao Wang, Lu Chen\",\"doi\":\"10.1117/12.3009375\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces the simulation of the thermal focal length brought by the Conduction Cooling End-Pumped Slat(CCEPS) laser amplification module under the action of thermal stress. Through simulation analysis, it is found that the thermal focal length of CCEPS lath crystal is affected by two factors, temperature distribution and stress distribution. One of these two factors brings a positive lens effect, the other may bring a negative lens effect, and it may also bring a positive lens effect at the same time. In order to find out the law of thermal lens effect in CCEPS module, a comprehensive simulation analysis of CCEPS module is carried out. This paper provides a strong theoretical support for further experimental verification.\",\"PeriodicalId\":502341,\"journal\":{\"name\":\"Applied Optics and Photonics China\",\"volume\":\"87 \",\"pages\":\"129591E - 129591E-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Optics and Photonics China\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.3009375\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Optics and Photonics China","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.3009375","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation of thermal focal length of conduction cooling end-pumped slat laser amplifier
This paper introduces the simulation of the thermal focal length brought by the Conduction Cooling End-Pumped Slat(CCEPS) laser amplification module under the action of thermal stress. Through simulation analysis, it is found that the thermal focal length of CCEPS lath crystal is affected by two factors, temperature distribution and stress distribution. One of these two factors brings a positive lens effect, the other may bring a negative lens effect, and it may also bring a positive lens effect at the same time. In order to find out the law of thermal lens effect in CCEPS module, a comprehensive simulation analysis of CCEPS module is carried out. This paper provides a strong theoretical support for further experimental verification.