{"title":"大长径比单微通道板的性能评估","authors":"B. Yan, Shulin Liu, Binting Zhang, Huaxing Peng","doi":"10.1088/1748-0221/18/12/P12011","DOIUrl":null,"url":null,"abstract":"The conventional microchannel plate (MCP) detector has found widespread application in various fields. This article focuses on investigating the performance of a single MCP with a large length-to-diameter ratio (L/D) of 80:1, particularly for single electron counting. To enhance MCP performance, alumina with a high secondary electron yield (SEY) is coated onto the MCP using atomic layer deposition (ALD). The SEYs of alumina thin films with different thicknesses are measured using a pulsing electron beam method. The 80:1 L/D MCPs operate in electron counting mode, and the optimal alumina thickness is determined through a comparative study of MCP performance before and after coating. The relationships between maximum SEY, primary electron energy, gain, peak-to-valley ratio (P/V), and pulse height resolution (PHR) are analyzed. After alumina coating, the single 80:1 MCP exhibits improved gain, P/V and PHR. The optimal P/V and PHR of a single MCP as functions of the primary electron energy align with the relationship between the SEY of the alumina coating and the primary electron energy. Additionally, the variation of DC gain with extracted charge is investigated. This article provides valuable insights for parameter selection in achieving the optimal working state of MCP and explores the potential application of single electron counting using a single MCP.","PeriodicalId":16184,"journal":{"name":"Journal of Instrumentation","volume":"165 2","pages":""},"PeriodicalIF":1.3000,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Performance evaluation of a single microchannel plate with large length-to-diameter ratio\",\"authors\":\"B. Yan, Shulin Liu, Binting Zhang, Huaxing Peng\",\"doi\":\"10.1088/1748-0221/18/12/P12011\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The conventional microchannel plate (MCP) detector has found widespread application in various fields. This article focuses on investigating the performance of a single MCP with a large length-to-diameter ratio (L/D) of 80:1, particularly for single electron counting. To enhance MCP performance, alumina with a high secondary electron yield (SEY) is coated onto the MCP using atomic layer deposition (ALD). The SEYs of alumina thin films with different thicknesses are measured using a pulsing electron beam method. The 80:1 L/D MCPs operate in electron counting mode, and the optimal alumina thickness is determined through a comparative study of MCP performance before and after coating. The relationships between maximum SEY, primary electron energy, gain, peak-to-valley ratio (P/V), and pulse height resolution (PHR) are analyzed. After alumina coating, the single 80:1 MCP exhibits improved gain, P/V and PHR. The optimal P/V and PHR of a single MCP as functions of the primary electron energy align with the relationship between the SEY of the alumina coating and the primary electron energy. Additionally, the variation of DC gain with extracted charge is investigated. This article provides valuable insights for parameter selection in achieving the optimal working state of MCP and explores the potential application of single electron counting using a single MCP.\",\"PeriodicalId\":16184,\"journal\":{\"name\":\"Journal of Instrumentation\",\"volume\":\"165 2\",\"pages\":\"\"},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2023-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Instrumentation\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1088/1748-0221/18/12/P12011\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Instrumentation","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1088/1748-0221/18/12/P12011","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
Performance evaluation of a single microchannel plate with large length-to-diameter ratio
The conventional microchannel plate (MCP) detector has found widespread application in various fields. This article focuses on investigating the performance of a single MCP with a large length-to-diameter ratio (L/D) of 80:1, particularly for single electron counting. To enhance MCP performance, alumina with a high secondary electron yield (SEY) is coated onto the MCP using atomic layer deposition (ALD). The SEYs of alumina thin films with different thicknesses are measured using a pulsing electron beam method. The 80:1 L/D MCPs operate in electron counting mode, and the optimal alumina thickness is determined through a comparative study of MCP performance before and after coating. The relationships between maximum SEY, primary electron energy, gain, peak-to-valley ratio (P/V), and pulse height resolution (PHR) are analyzed. After alumina coating, the single 80:1 MCP exhibits improved gain, P/V and PHR. The optimal P/V and PHR of a single MCP as functions of the primary electron energy align with the relationship between the SEY of the alumina coating and the primary electron energy. Additionally, the variation of DC gain with extracted charge is investigated. This article provides valuable insights for parameter selection in achieving the optimal working state of MCP and explores the potential application of single electron counting using a single MCP.
期刊介绍:
Journal of Instrumentation (JINST) covers major areas related to concepts and instrumentation in detector physics, accelerator science and associated experimental methods and techniques, theory, modelling and simulations. The main subject areas include.
-Accelerators: concepts, modelling, simulations and sources-
Instrumentation and hardware for accelerators: particles, synchrotron radiation, neutrons-
Detector physics: concepts, processes, methods, modelling and simulations-
Detectors, apparatus and methods for particle, astroparticle, nuclear, atomic, and molecular physics-
Instrumentation and methods for plasma research-
Methods and apparatus for astronomy and astrophysics-
Detectors, methods and apparatus for biomedical applications, life sciences and material research-
Instrumentation and techniques for medical imaging, diagnostics and therapy-
Instrumentation and techniques for dosimetry, monitoring and radiation damage-
Detectors, instrumentation and methods for non-destructive tests (NDT)-
Detector readout concepts, electronics and data acquisition methods-
Algorithms, software and data reduction methods-
Materials and associated technologies, etc.-
Engineering and technical issues.
JINST also includes a section dedicated to technical reports and instrumentation theses.