通过重建的形状图像测量不规则颗粒的大小

IF 2 4区物理与天体物理 Q3 OPTICS

Journal of Optics Pub Date : 2023-12-20 DOI:10.1088/2040-8986/ad14e8

Jinlu Sun, Yue Qiu, Cheng Zhang, Yuhang Wu, Yuqiang Li, Changyun Miao

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引用次数: 0

摘要

本文提出了一种测量不规则颗粒大小的方法。利用干涉颗粒成像技术获得干涉离焦图像后，可获得颗粒图像的最小边界矩形框，并通过卷积神经网络重建颗粒形状。根据最小边界矩形框可获得粒子图像像素数。根据颗粒大小和像素大小之间的关系分析，使用方框计数法定义新的像素大小。然后得到颗粒的宽度和高度。宽度和高度的最大相对误差分别为 1.47% 和 1.16%。结果表明，所提出的方法可为实现颗粒的三维尺寸测量提供研究基础。

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Measurement of irregular particle size from the reconstructed shape images

A method for measuring the size of irregular particles is proposed. The smallest bounding rectangular box of the particle image can be acquired after obtaining interferometric out-of-focus image by using interferometric particle imaging technology and reconstructing particle shape through convolutional neural network. The number of image pixels of the particle can be obtained from the smallest bounding rectangular box. A new pixel size is defined by using the box counting method based on the analysis of the relationship between particle size and pixel size. The width and height of the particles are then obtained. The maximum relative errors in width and height are 1.47% and 1.16%, respectively. The results indicate that the proposed method can provide a research basis for the realization of three-dimensional size measurement of particles.

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来源期刊

Journal of Optics OPTICS-

CiteScore

4.50

自引率

4.80%

发文量

237

审稿时长

1.9 months

期刊介绍： Journal of Optics publishes new experimental and theoretical research across all areas of pure and applied optics, both modern and classical. Research areas are categorised as: Nanophotonics and plasmonics Metamaterials and structured photonic materials Quantum photonics Biophotonics Light-matter interactions Nonlinear and ultrafast optics Propagation, diffraction and scattering Optical communication Integrated optics Photovoltaics and energy harvesting We discourage incremental advances, purely numerical simulations without any validation, or research without a strong optics advance, e.g. computer algorithms applied to optical and imaging processes, equipment designs or material fabrication.