纳米晶氧化铟薄膜中原子对相关性的取向分析。

IF 2.9 2区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
IUCrJ Pub Date : 2024-01-01 DOI:10.1107/S2052252523010357
Justin M. Hoffman , Niklas B. Thompson , Olaf Borkiewicz , Xiang He , Samuel Amsterdam , Zhu-lin Xie , Aaron Taggart , Karen L. Mulfort , Alex B. F. Martinson , Lin X. Chen , Uta Ruett , David M. Tiede , I. Robinson (Editor)
{"title":"纳米晶氧化铟薄膜中原子对相关性的取向分析。","authors":"Justin M. Hoffman ,&nbsp;Niklas B. Thompson ,&nbsp;Olaf Borkiewicz ,&nbsp;Xiang He ,&nbsp;Samuel Amsterdam ,&nbsp;Zhu-lin Xie ,&nbsp;Aaron Taggart ,&nbsp;Karen L. Mulfort ,&nbsp;Alex B. F. Martinson ,&nbsp;Lin X. Chen ,&nbsp;Uta Ruett ,&nbsp;David M. Tiede ,&nbsp;I. Robinson (Editor)","doi":"10.1107/S2052252523010357","DOIUrl":null,"url":null,"abstract":"<div><p>Grazing-incidence total X-ray scattering allows for orientational pair distribution function analysis of indium oxide thin films with only a single measurement. Elucidation of information such as effects of film anisotropy on bond lengths in specific orientations relative to the substrate and determination of orientation in X-ray amorphous films is demonstrated.</p></div><div><p>The application of grazing-incidence total X-ray scattering (GITXS) for pair distribution function (PDF) analysis using &gt;50 keV X-rays from synchrotron light sources has created new opportunities for structural characterization of supported thin films with high resolution. Compared with grazing-incidence wide-angle X-ray scattering, which is only useful for highly ordered materials, GITXS/PDFs expand such analysis to largely disordered or nanostructured materials by examining the atomic pair correlations dependent on the direction relative to the surface of the supporting substrate. A characterization of nanocrystalline In<sub>2</sub>O<sub>3</sub>-derived thin films is presented here with in-plane-isotropic and out-of-plane-anisotropic orientational ordering of the atomic structure, each synthesized using different techniques. The atomic orientations of such films are known to vary based on the synthetic conditions. Here, an azimuthal orientational analysis of these films using GITXS with a single incident angle is shown to resolve the markedly different orientations of the atomic structures with respect to the planar support and the different degrees of long-range order, and hence, the terminal surface chemistries. It is anticipated that orientational analysis of GITXS/PDF data will offer opportunities to extend structural analyses of thin films by providing a means to qualitatively determine the major atomic orientation within nanocrystalline and, eventually, non-crystalline films.</p></div>","PeriodicalId":14775,"journal":{"name":"IUCrJ","volume":null,"pages":null},"PeriodicalIF":2.9000,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10833382/pdf/","citationCount":"0","resultStr":"{\"title\":\"Orientational analysis of atomic pair correlations in nanocrystalline indium oxide thin films\",\"authors\":\"Justin M. Hoffman ,&nbsp;Niklas B. Thompson ,&nbsp;Olaf Borkiewicz ,&nbsp;Xiang He ,&nbsp;Samuel Amsterdam ,&nbsp;Zhu-lin Xie ,&nbsp;Aaron Taggart ,&nbsp;Karen L. Mulfort ,&nbsp;Alex B. F. Martinson ,&nbsp;Lin X. Chen ,&nbsp;Uta Ruett ,&nbsp;David M. Tiede ,&nbsp;I. Robinson (Editor)\",\"doi\":\"10.1107/S2052252523010357\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Grazing-incidence total X-ray scattering allows for orientational pair distribution function analysis of indium oxide thin films with only a single measurement. Elucidation of information such as effects of film anisotropy on bond lengths in specific orientations relative to the substrate and determination of orientation in X-ray amorphous films is demonstrated.</p></div><div><p>The application of grazing-incidence total X-ray scattering (GITXS) for pair distribution function (PDF) analysis using &gt;50 keV X-rays from synchrotron light sources has created new opportunities for structural characterization of supported thin films with high resolution. Compared with grazing-incidence wide-angle X-ray scattering, which is only useful for highly ordered materials, GITXS/PDFs expand such analysis to largely disordered or nanostructured materials by examining the atomic pair correlations dependent on the direction relative to the surface of the supporting substrate. A characterization of nanocrystalline In<sub>2</sub>O<sub>3</sub>-derived thin films is presented here with in-plane-isotropic and out-of-plane-anisotropic orientational ordering of the atomic structure, each synthesized using different techniques. The atomic orientations of such films are known to vary based on the synthetic conditions. Here, an azimuthal orientational analysis of these films using GITXS with a single incident angle is shown to resolve the markedly different orientations of the atomic structures with respect to the planar support and the different degrees of long-range order, and hence, the terminal surface chemistries. It is anticipated that orientational analysis of GITXS/PDF data will offer opportunities to extend structural analyses of thin films by providing a means to qualitatively determine the major atomic orientation within nanocrystalline and, eventually, non-crystalline films.</p></div>\",\"PeriodicalId\":14775,\"journal\":{\"name\":\"IUCrJ\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.9000,\"publicationDate\":\"2024-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10833382/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IUCrJ\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/org/science/article/pii/S2052252524000137\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"CHEMISTRY, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IUCrJ","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/org/science/article/pii/S2052252524000137","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

将掠入射全 X 射线散射 (GITXS) 应用于利用同步辐射光源发出的大于 50 keV 的 X 射线进行原子对分布函数 (PDF) 分析,为高分辨率的支撑薄膜结构表征创造了新的机会。掠入射广角 X 射线散射仅适用于高度有序的材料,与之相比,GITXS/PDF 通过检查与支撑基底表面相对方向有关的原子对相关性,将此类分析扩展到基本无序或纳米结构材料。本文介绍了纳米晶 In2O3 衍生薄膜的特性,这些薄膜的原子结构具有平面内各向异性和平面外各向异性取向有序性,每种薄膜都是用不同的技术合成的。众所周知,此类薄膜的原子取向会因合成条件的不同而变化。在这里,使用 GITXS 对这些薄膜进行了单入射角方位角取向分析,结果表明,相对于平面支撑物和不同程度的长程有序性,原子结构的取向明显不同,因此,终端表面化学性质也不同。预计 GITXS/PDF 数据的取向分析将为扩展薄膜结构分析提供机会,提供一种定性确定纳米结晶薄膜以及最终非结晶薄膜中主要原子取向的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Orientational analysis of atomic pair correlations in nanocrystalline indium oxide thin films

Grazing-incidence total X-ray scattering allows for orientational pair distribution function analysis of indium oxide thin films with only a single measurement. Elucidation of information such as effects of film anisotropy on bond lengths in specific orientations relative to the substrate and determination of orientation in X-ray amorphous films is demonstrated.

The application of grazing-incidence total X-ray scattering (GITXS) for pair distribution function (PDF) analysis using >50 keV X-rays from synchrotron light sources has created new opportunities for structural characterization of supported thin films with high resolution. Compared with grazing-incidence wide-angle X-ray scattering, which is only useful for highly ordered materials, GITXS/PDFs expand such analysis to largely disordered or nanostructured materials by examining the atomic pair correlations dependent on the direction relative to the surface of the supporting substrate. A characterization of nanocrystalline In2O3-derived thin films is presented here with in-plane-isotropic and out-of-plane-anisotropic orientational ordering of the atomic structure, each synthesized using different techniques. The atomic orientations of such films are known to vary based on the synthetic conditions. Here, an azimuthal orientational analysis of these films using GITXS with a single incident angle is shown to resolve the markedly different orientations of the atomic structures with respect to the planar support and the different degrees of long-range order, and hence, the terminal surface chemistries. It is anticipated that orientational analysis of GITXS/PDF data will offer opportunities to extend structural analyses of thin films by providing a means to qualitatively determine the major atomic orientation within nanocrystalline and, eventually, non-crystalline films.

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来源期刊
IUCrJ
IUCrJ CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.50
自引率
5.10%
发文量
95
审稿时长
10 weeks
期刊介绍: IUCrJ is a new fully open-access peer-reviewed journal from the International Union of Crystallography (IUCr). The journal will publish high-profile articles on all aspects of the sciences and technologies supported by the IUCr via its commissions, including emerging fields where structural results underpin the science reported in the article. Our aim is to make IUCrJ the natural home for high-quality structural science results. Chemists, biologists, physicists and material scientists will be actively encouraged to report their structural studies in IUCrJ.
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