Jongmin Lee, Jung-Hwa Kim, Sungbin Park, Yong Sung You, Jae-seok Lee, Y. Ghim, Y.S. Hwang
{"title":"在 SNU X-pinch 设备上开发集体汤姆逊散射诊断系统","authors":"Jongmin Lee, Jung-Hwa Kim, Sungbin Park, Yong Sung You, Jae-seok Lee, Y. Ghim, Y.S. Hwang","doi":"10.1088/1748-0221/18/12/C12004","DOIUrl":null,"url":null,"abstract":"The Collective Thomson Scattering (CTS) diagnostic system has been developed for the X-pinch device at Seoul National University. The system is designed to measure various parameters of plasma jets, including plasma temperature and plasma flow velocity. For the flow velocity measurement, the second harmonic Nd:YAG laser and the collection optics are oriented in order to ensure the scattering vector is aligned with the flow direction. The collection optics have been optimized to maximize photon efficiency. Due to the requirement of high spectral dispersion and resolution for the diagnosis of CTS spectra, the spectrometer is designed with a dispersion of 0.004 nm/pixel. The spectral dispersion and resolution of the system has been measured. The CTS diagnostic system will contribute to a deeper understanding of X-pinch plasma dynamics and the development of advanced High Energy Density Plasma (HEDP)-based technologies.","PeriodicalId":16184,"journal":{"name":"Journal of Instrumentation","volume":"24 13","pages":""},"PeriodicalIF":1.3000,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of a Collective Thomson Scattering diagnostic system on SNU X-pinch device\",\"authors\":\"Jongmin Lee, Jung-Hwa Kim, Sungbin Park, Yong Sung You, Jae-seok Lee, Y. Ghim, Y.S. Hwang\",\"doi\":\"10.1088/1748-0221/18/12/C12004\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Collective Thomson Scattering (CTS) diagnostic system has been developed for the X-pinch device at Seoul National University. The system is designed to measure various parameters of plasma jets, including plasma temperature and plasma flow velocity. For the flow velocity measurement, the second harmonic Nd:YAG laser and the collection optics are oriented in order to ensure the scattering vector is aligned with the flow direction. The collection optics have been optimized to maximize photon efficiency. Due to the requirement of high spectral dispersion and resolution for the diagnosis of CTS spectra, the spectrometer is designed with a dispersion of 0.004 nm/pixel. The spectral dispersion and resolution of the system has been measured. The CTS diagnostic system will contribute to a deeper understanding of X-pinch plasma dynamics and the development of advanced High Energy Density Plasma (HEDP)-based technologies.\",\"PeriodicalId\":16184,\"journal\":{\"name\":\"Journal of Instrumentation\",\"volume\":\"24 13\",\"pages\":\"\"},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2023-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Instrumentation\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1088/1748-0221/18/12/C12004\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Instrumentation","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1088/1748-0221/18/12/C12004","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
Development of a Collective Thomson Scattering diagnostic system on SNU X-pinch device
The Collective Thomson Scattering (CTS) diagnostic system has been developed for the X-pinch device at Seoul National University. The system is designed to measure various parameters of plasma jets, including plasma temperature and plasma flow velocity. For the flow velocity measurement, the second harmonic Nd:YAG laser and the collection optics are oriented in order to ensure the scattering vector is aligned with the flow direction. The collection optics have been optimized to maximize photon efficiency. Due to the requirement of high spectral dispersion and resolution for the diagnosis of CTS spectra, the spectrometer is designed with a dispersion of 0.004 nm/pixel. The spectral dispersion and resolution of the system has been measured. The CTS diagnostic system will contribute to a deeper understanding of X-pinch plasma dynamics and the development of advanced High Energy Density Plasma (HEDP)-based technologies.
期刊介绍:
Journal of Instrumentation (JINST) covers major areas related to concepts and instrumentation in detector physics, accelerator science and associated experimental methods and techniques, theory, modelling and simulations. The main subject areas include.
-Accelerators: concepts, modelling, simulations and sources-
Instrumentation and hardware for accelerators: particles, synchrotron radiation, neutrons-
Detector physics: concepts, processes, methods, modelling and simulations-
Detectors, apparatus and methods for particle, astroparticle, nuclear, atomic, and molecular physics-
Instrumentation and methods for plasma research-
Methods and apparatus for astronomy and astrophysics-
Detectors, methods and apparatus for biomedical applications, life sciences and material research-
Instrumentation and techniques for medical imaging, diagnostics and therapy-
Instrumentation and techniques for dosimetry, monitoring and radiation damage-
Detectors, instrumentation and methods for non-destructive tests (NDT)-
Detector readout concepts, electronics and data acquisition methods-
Algorithms, software and data reduction methods-
Materials and associated technologies, etc.-
Engineering and technical issues.
JINST also includes a section dedicated to technical reports and instrumentation theses.