具有电压相关活性表面的 SWCNT-Si 光电探测器

D. Capista, L. Lozzi, A. Di Bartolomeo, F. Giubileo, N. Martucciello, Maurizio Passacantando
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摘要

关于碳纳米管-硅MIS异质结构的新研究表明,可以利用器件上绝缘层的厚度不均匀性来提高其功能。在这项工作中,我们报告了在n型硅衬底上由单壁碳纳米管(SWCNT)薄膜组成的器件的制造和表征,其中纳米管和硅之间的氮化物夹层被故意蚀刻以获得不同的厚度。三种不同的氮化硅厚度允许在同一器件内部形成三个区域,每个区域具有不同的光电流和响应性行为。我们表明,通过选择特定的偏置,区域的光响应可以打开和关闭。这种特殊的行为允许该器件用作具有电压依赖活性表面的光电探测器。对器件表面的扫描光响应成像,在不同偏置下进行,突出了这种行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SWCNT-Si Photodetector with Voltage-Dependent Active Surface
New works on Carbon Nanotubes-Silicon MIS heterostructures showed that the presence of thickness inhomogeneities in the insulating layer across the device can be exploited increase its functionalities. In this work, we report the fabrication and the characterization of a device consisting of a Single-Walled Carbon Nanotube (SWCNT) film onto an n-type silicon substrate where the nitride interlayer between the nanotubes and the silicon has been intentionally etched to obtain different thickness. Three different silicon nitride thicknesses allow the formation of three regions, inside the same device, each with different photocurrents and responsivity behaviors. We show that by selecting specific biases, the photoresponse of the regions can be switched on and off. This peculiar behavior allows the device to be used as a photodetector with a voltage dependent active surface. Scanning photo response imaging of the device surface, performed at different biases highlight this behavior.
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